Applied Microscopy

Korean Society of Microscopy (한국현미경학회)
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A Brief Overview of Atom Probe Tomography Research

  • Gault, Baptiste (Department of Microstructure Physics and Alloy Design, Max-Planck-Institut fur Eisenforschung GmbH)
  • Received : 2016.09.23
  • Accepted : 2016.09.26
  • Published : 2016.09.30
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Abstract

Atom probe tomography (APT) has been fast rising in prominence over the past decade as a key tool for nanoscale analytical characterization of a range of materials systems. APT provides three-dimensional mapping of the atom distribution in a small volume of solid material. The technique has evolved, with the incorporation of laser pulsing capabilities, and, combined with progress in specimen preparation, APT is now able to analyse a very range of materials, beyond metals and alloys that used to be its core applications. The present article aims to provide an overview of the technique, providing a brief historical perspective, discussing recent progress leading to the state-of-the-art, some perspectives on its evolution, with targeted examples of applications.

Keywords

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