References
- Ahmadi J, Jozani MJ, Marchand E, and Parsian A (2009). Bayes estimation based on k-record data from a general class of distributions under balanced type loss functions, Journal of Statistical Planning and Inference, 139, 1180-1189 https://doi.org/10.1016/j.jspi.2008.07.008
- Bai DS, Kim MS, and Lee SH (1989). Optimum simple step-stress accelerated life tests with censoring, IEEE Transactions on Reliability, 38, 528-532. https://doi.org/10.1109/24.46476
- Balakrishnan N and Aggarwala R (2000). Progressive Censoring: Theory, Methods, and Applications, Birkhauser, Boston.
- Balakrishnan N and Cramer E (2014). The Art of Progressive Censoring: Applications to Reliability and Quality, Birkhauser, New York.
- Balakrishnan N, Kundu D, Ng HKT, and Kannan N (2007). Point and interval estimation for a simple step-stress model with type-II censoring, Journal of Quality Technology, 39, 35-47. https://doi.org/10.1080/00224065.2007.11917671
- Efron B and Tibshirani RJ (1993). An Introduction to the Bootstrap, Chapman & Hall, London.
- Gouno E, Sen A, and Balakrishnan N (2004). Optimal step-stress test under progressive type-I censoring, IEEE Transactions on Reliability, 53, 388-393. https://doi.org/10.1109/TR.2004.833320
- Ismail AA (2012). Estimating the parameters of Weibull distribution and the acceleration factor from hybrid partially accelerated life test, Applied Mathematical Modelling, 36, 2920-2925. https://doi.org/10.1016/j.apm.2011.09.083
- Ismail AA (2014). Inference for a step-stress partially accelerated life test model with an adaptive type-II progressively hybrid censored data from Weibull distribution, Journal of Computational and Applied Mathematics, 260, 533-542. https://doi.org/10.1016/j.cam.2013.10.014
- Kim C, Jung J, and Chung Y (2011). Bayesian estimation for the generalized Weibull model under type II progressive censoring, Statistical Papers, 52, 53-70. https://doi.org/10.1007/s00362-009-0203-2
- Miller R (1981). Survival Analysis, Wiley, New York.
- Miller R and Nelson W (1983). Optimum simple step-stress plans for accelerated life testing, IEEE Transactions on Reliability, 32, 59-65.
- Mohie El-Din MM, Abu-Youssef SE, Ali NSA, and Abd El-Raheem AM (2015a). Estimation in step-stress accelerated life tests for Weibull distribution with progressive first-failure censoring, Journal of Statistics Applications & Probability, 3, 403-411.
- Mohie El-Din MM, Abu-Youssef SE, Ali NSA, and Abd El-Raheem AM (2015b). Estimation in step-stress accelerated life tests for power generalized Weibull distribution with progressive censoring, Advances in Statistics, 2015, 1-13.
- Mohie El-Din MM, Abu-Youssef SE, Ali NSA, and Abd El-Raheem AM (2016). Estimation in constant-stress accelerated life tests for extension of the exponential distribution under progressive censoring, Metron, 7, 1-21.
- Nadarajah S and Haghighi F (2011). An extension of the exponential distribution, Statistics, 45, 543-558. https://doi.org/10.1080/02331881003678678
- Nassar MM and Eissa FH (2005). Bayesian estimation for the exponentiated Weibull model, Communications in Statistics - Theory and Methods, 33, 2343-2362. https://doi.org/10.1081/STA-200031447
- Nelson W (1990). Accelerated Testing: Statistical Models, Test Plans and Data Analysis,Wiley, New York.
- Pakyari R and Balakrishnan N (2012). A general purpose approximate goodness-of-fit test for progressively type-II censored data, IEEE Transactions on Reliability, 61, 238-244. https://doi.org/10.1109/TR.2012.2182811
- Singh SK, Singh U, Kumar M, and Vishwakarma PK (2014a). Classical and Bayesian inference for an extension of the exponential distribution under progressive type-II censored data with binomial removals, Journal of Statistics Applications & Probability Letters, 1, 75-86. https://doi.org/10.12785/jsapl/010304
- Singh SK, Singh U, and Sharma VK (2014b). Bayesian estimation and prediction for the generalized Lindley distribution under asymmetric loss function, Hacettepe Journal of Mathematics and Statistics, 43, 661-678.
- Srivastava PW and Shukla R (2008a). A log-logistic step-stress model, IEEE Transactions on Reliability, 57, 431-434. https://doi.org/10.1109/TR.2008.928182
- Srivastava PW and Shukla R (2008b). Optimum log-logistic step-stress model with censoring, International Journal of Quality & Reliability Management, 25, 968-976. https://doi.org/10.1108/02656710810908115
- Srivastava PW and Mittal N (2010). Optimum step-stress partially accelerated life tests for the truncated logistic distribution with censoring, Applied Mathematical Modelling, 34, 3166-3178. https://doi.org/10.1016/j.apm.2010.02.007
- Upadhyay SK and Gupta A (2010). A Bayes analysis of modified Weibull distribution via Markov chain Monte Carlo simulation, Journal of Statistical Computation and Simulation, 80, 241-254. https://doi.org/10.1080/00949650802600730
- Zhu Y (2010). Optimal design and equivalency of accelerated life testing plans (Doctoral dissertation), Rutgers University, New Brunswick, NJ.