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Verification Study of Lifetime Prediction Models for Pb-Based and Pb-Free Solders Used in Chip Resistor Assemblies Under Thermal Cycling

온도변화 환경에서 칩저항 실장용 유·무연솔더의 수명모델 검증연구

  • Han, Changwoon (Robust Components and System Research Center, Korea Electronics Technology Institute)
  • 한창운 (전자부품연구원 시스템로버스트연구센터)
  • Received : 2015.05.03
  • Accepted : 2015.12.26
  • Published : 2016.03.01

Abstract

Recently, life prediction models for Pb-based and Pb-free solders used in chip resistor assemblies under thermal cycling have been introduced. The models suggest that the field lifetimes of Pb-free solders would be better than those of Pb-based solders when used for chip resistors under thermal cycling conditions, while the lifetime of the chip assemblies under accelerated test conditions show a reverse relationship. In this study, the prediction models were verified by applying the model to another research case. Finite element models were built, thermal cycling conditions were applied, and the energy densities were calculated. Finally, life prediction analysis was conducted for the cases where Pb-based and Pb-free solders were used. The prediction results were then compared with the test data of the case. It was verified that the predictions of the developed life cycle models are on the practical scale.

최근에 온도변화 환경에서 칩저항 실장용 유 무연 솔더의 수명예측모델이 개발되었다. 개발된 수명예측모델에 의하면 가속조건에서는 칩저항 실장 무연솔더가 유연솔더보다 수명이 적은 것으로 나타나지만, 실제조건에서는 무연솔더의 신뢰성이 유연솔더보다 우수하다. 본 연구에서는 개발된 수명예측모델의 검증 연구를 수행한다. 수명예측모델을 다른 칩저항 실장 유 무연 솔더 시험 결과에 적용하고 비교하기 위해서, 유한요소모델을 개발하고 시험 온도사이클 조건을 적용한다. 변형율 에너지 밀도를 계산하고 수명을 예측한다. 마지막으로 유 무연 솔더에 대해서 예측결과를 시험결과와 비교한다. 검증 결과는 개발된 수명예측모델이 사용 가능한 범위에서 수명을 예측할 수 있음을 보인다.

Keywords

References

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