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실리콘광증배관 기반의 미세기둥 구조 CsI:Tl 제작 및 평가

Fabrication and Performance of Microcolumnar CsI:Tl onto Silicon Photomultiplier

  • 투고 : 2016.09.23
  • 심사 : 2016.11.29
  • 발행 : 2016.12.31

초록

본 연구에서는 SiPM에 열진공증착법을 이용하여 증착한 미세기둥 구조의 CsI:Tl의 감마선 분광특성연구를 진행하였다. SEM장비를 사용하여 미세기둥 구조의 CsI:Tl의 두께와 각각의 CsI:Tl 미세기둥의 두께를 측정하였다. SEM 관측 결과 CsI:Tl의 두께는 $450{\mu}m$, $600{\mu}m$이다. SiPM에 $450{\mu}m$, $600{\mu}m$ 두께로 증착한 미세기둥 구조의 CsI:Tl은 표준 감마선원인 $^{133}Ba$, $^{137}Cs$를 사용하여 감마선의 분광특성 평가를 진행하였다. SiPM에 증착한 미세기둥 구조 CsI:Tl의 분광특성 평가는 $^{137}Cs$ 감마선 세기에 따른 응답 선형성과, 감마선 에너지 스펙트럼을 측정하였다. SiPM에 증착한 두께 $450{\mu}m$$600{\mu}m$ CsI:Tl은 감마선 세기에 따라 선형성을 나타났다. 또한 $^{133}Ba$$^{137}Cs$의 감마선 에너지 스펙트럼 측정 결과 $450{\mu}m$ 두께의 CsI:Tl은 $^{133}Ba$에 대한 특성이 좋게 평가되었고, $600{\mu}m$ 두께의 CsI:Tl은 $^{137}Cs$에서 우수한 특성을 확인할 수 있었다.

This study conducted the gamma ray spectroscopic analysis of the microcolumnar CsI:Tl deposited onto the SiPMs using thermal evaporation deposition. The SEM measured thickness of microcolumnar CsI:Tl and of its individual columns. From the SEM observation, the measured thickness of CsI:Tl were $450{\mu}m$ and $600{\mu}m$. The gamma ray spectroscopic properties of microcolumnar CsI:Tl, $450{\mu}m$ and $600{\mu}m$ thick deposited onto the SiPMs were analyzed using standard gamma ray sources $^{133}Ba$ and $^{137}Cs$. The spectroscopic analysis of microcolumnar CsI:Tl deposited onto the SiPMs included the measurements of response linearity over the $^{137}Cs$ gamma ray intensity; and gamma ray energy spectrum. Furthermore from the gamma ray spectrum measurement of $^{133}Ba$ and $^{137}Cs$, $450{\mu}m$ thick CsI:Tl showed good efficiency when measured with $^{133}Ba$ and $600{\mu}m$ thick CsI:Tl was highly efficient when measured with $^{137}Cs$.

키워드

참고문헌

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