References
- L. T. Su, J. E. Chung, D. A. Antoniadis, K. E. Goodson, and M. I. Flik, "Measurement and modeling of self-heating in SOI nMOSFET's," IEEE Trans. Electron Devices, vol. 41, no. 1, pp. 69-75, Jan. 1994. https://doi.org/10.1109/16.259622
- S. Cho, J. S. Lee, K. R. Kim, B. G. Park, J. S. Harris, and I. M. Kang, "Analyses on small-signal parameters and radio-frequency modeling of gate-all-around tunneling field-effect transistors," IEEE Trans. Electron Devices, vol. 58, no. 12, pp. 4164-4171, Dec. 2011. https://doi.org/10.1109/TED.2011.2167335
- Makovejev, Sergej, Sarah Olsen, and J. Raskin. "RF extraction of self-heating effects in FinFETs." IEEE Trans. Electron Devices, vol. 58, no. 10, pp. 3335-3341, Oct. 2011. https://doi.org/10.1109/TED.2011.2162333
- M. Braccioli, G. Curatola, Y. Yang, E. Sangiorgi, and C. Fiegna, "Simulation of self-heating effects in different SOI MOS architectures," Solid State Electron., vol. 53, no. 4, pp. 445-451, Apr. 2009. https://doi.org/10.1016/j.sse.2008.09.020
- C. Fiegna, Y. Yang, E. Sangiorgi, and A. G. O'Neill, "Analysis of self-heating effects in ultrathin-body SOI MOSFETs by device simulation," IEEE Trans. Electron Devices, vol. 55, no.1, pp. 233-244, Jan. 2008. https://doi.org/10.1109/TED.2007.911354
- M. Braccioli, G. Curatola, Y. Yang, E. Sangiorgi, and C. Fiegna, "Simulation of self-heating effects in 30nm gate length FinFET," in Proc. Int. Conf. ULIS, pp. 71-74, 2008.
- Shrivastava, Mayank, et al. "Physical insight toward heat transport and an improved electrothermal modeling framework for FinFET architectures." IEEE Trans. Electron Devices, vol. 59, no. 5, pp.1353-1363, May 2012 https://doi.org/10.1109/TED.2012.2188296
- Sentaurus Device User Guide, Ver. C-2009.06, Synopsis.
- S. Makovejev, S. H. Olsen, V. Kilchytska, and J.-P. Raskin, "Time and Frequency Domain Characterization of Transistor Self-Heating," IEEE Trans. Electron Devices, vol. 60, no. 6, pp. 1844-1851, 2013. https://doi.org/10.1109/TED.2013.2259174
- A. J. Scholten, G. D. J. Smit, R. M. T. Pijper, L. F. Tiemeijer, H. P. Tuinhout, J.-L. P. J. van der Steen, A. Mercha, M. Braccioli, and D. B. M. Klaassen, "Experimental assessment of self-heating in SOI FinFETs," in IEDM Tech. Dig., 2009, pp. 305-308.
- T. Takahashi, N. Beppu, K. Chen, S. Oda, and K. Uchida, "Thermal-Aware Device Design of Nanoscale Bulk/SOI FinFETs: Suppression of Operation Temperature and Its Variability," Tech. Dig. IEDM, pp. 177-180, 2011.
- Pop, Eric, Sanjiv Sinha, and Kenneth E. Goodson, "Heat Generation and Transport in Nanometer - Scale Transistors," Proceedings of the IEEE, vol. 94, no. 8, pp. 1587-1601, Aug. 2006. https://doi.org/10.1109/JPROC.2006.879794