References
- H. Yim, S.-Y. Yoo, S. Nahm, S.-J. Hwang, S.-J. Yoon, and J.-W. Choi, "Synthesis and dielectric properties of HCa2Nb3O10 layered structure ceramics", Ceramics International, Vol. 39, No. 1, pp. 611-614, 2013. https://doi.org/10.1016/j.ceramint.2012.06.072
- T. Tsurumi, "Technology in the future of high capacity multilayer ceramics capacitor", Mater Integr., Vol. 21, pp. 59-70, 2008.
- G. Nocerino, and K. Singer, "The electrical and compositional structure of thin Ni-Cr films", Thin Solid Films, Vol. 57, No. 2, pp. 343-348, 1979. https://doi.org/10.1016/0040-6090(79)90176-7
- Y. Nakano, T. Nomura, and T. Takenaka, "Residual stress of multilayer ceramic capacitors with Ni-electrodes (Ni-MLCCs)", Japanese journal of applied physics, Vol. 42, No. 9B, pp. 6041, 2003. https://doi.org/10.1143/JJAP.42.6041
- Y. Seol, J. Lee, and N.-E. Lee, "Effects of different electroplated gate electrodes on electrical performances of flexible organic thin film transistor and flexibility improvement", Organic Electronics, Vol. 8, No. 5, pp. 513-521, 2007. https://doi.org/10.1016/j.orgel.2007.03.005
- C. Lee, B. Kang, M. Lee, S. Ahn, G. Stefanovich, W. Xianyu, K. Kim, J. Hur, H. Yin, and Y. Park, "Electromigration effect of Ni electrodes on the resistive switching characteristics of NiO thin films", Physics Letters, Vol. 91, No. 8, pp. 082104-082104-3, 2007.
- W. Gong, H. Li, Z. Zhao, and J. Chen, "Ultrafine particles of Fe, Co, and Ni ferromagnetic metals", J Appl Phys, Vol. 69, No. 8, pp. 5119-5121, 2007. https://doi.org/10.1063/1.348144
- K. Kawabata, T. Tanaka, A. Kitabatake, K. Yamada, Y. Mikami, H. Kajioka, and K. Toiyama, "High rate sputtering for Ni films by an rf-dc coupled magnetron sputtering system with multipolar magnetic plasma confinement." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 19, No. 4, pp. 1438-1441, 2001. https://doi.org/10.1116/1.1351796
- Y. Kwon, N.-H. Kim, G.-P. Choi, W.-S. Lee, Y.-J. Seo, and J. Park, "Structural and surface properties of Ni-Cr thin films prepared by DC magnetron sputtering under variation of annealing conditions." Microelectronic engineering, Vol. 82, No. 3, pp. 314-320, 2005. https://doi.org/10.1016/j.mee.2005.07.040
- C.-M. Wang, D. R. Baer, S. M. Bruemmer, M. H. Engelhard, M. E. Bowden, J. A. Sundararajan, and Y. Qiang, "Microstructure of the native oxide layer on Ni and Crdoped Ni nanoparticles." Journal of nanoscience and nanotechnology, Vol. 11, No. 10, pp. 8488-8497, 2011. https://doi.org/10.1166/jnn.2011.4964