The Journal of Korean Institute of Electromagnetic Engineering and Science (한국전자파학회논문지)

The Korean Institute of Electromagnetic Engineering and Science (한국전자파학회)
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Subcell Maxwell-Boltzmann FDTD Method for Analyzing Thin Plasma Layer

얇은 플라즈마 층의 전자기 해석을 위한 Subcell 맥스웰-볼츠만 유한 차분 시간 영역 기법

  • Jung, Inkyun (Department of Electrical and Electronics Engineering, Yonsei University) ;
  • Kim, Yuna (Department of Electrical and Electronics Engineering, Yonsei University) ;
  • Hong, Yongjun (Agency for Defense Development) ;
  • Yook, Jong-Gwan (Department of Electrical and Electronics Engineering, Yonsei University)
  • Received : 2015.01.05
  • Accepted : 2015.02.12
  • Published : 2015.03.31
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Abstract

Analyzing electromagnetic properties in plasma medium, it is difficult to numerically solve electromagnetic problem with thin plasma. In this paper, subcell Maxwell-Boltzmann FDTD method was proposed which is combined with Maxwell-Boltzmann FDTD and subcell FDTD method for analyzing plasma and electrically thin materials, respectively. Calculations of reflection coefficient and absorption rate error were performed by using 1D FDTD method. Reflection coefficient computed by applying the proposed method is in agreement with analytic solution. Absorption rate error analyzed by employing the proposed method is 1/10 times less than one by using conventional method.

플라즈마의 전자기적 특성을 해석하는 데 전기적으로 얇은 플라즈마는 수치 해석하기 어렵다. 본 논문은 플라즈마를 해석할 수 있는 맥스웰-볼츠만 유한 차분 시간 영역(Finite-Difference Time-Domain: FDTD) 기법과 얇은 구조를 해석할 수 있는 subcell FDTD 기법을 결합한 subcell 맥스웰-볼츠만 FDTD 기법을 제안하였다. 제안한 기법의 정확성을 확인하기 위해 1차원 FDTD 기법을 이용하여 자유 공간-플라즈마-완전 도체에서 반사계수 및 흡수량 오차를 계산하였다. 제안한 기법을 이용했을 때 광대역에서 정확한 것을 확인하였고, 플라즈마가 $3{\Delta}y$일 때 기존 기법보다 흡수량 오차가 1/10로 감소하는 것을 확인하였다.

Keywords

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