참고문헌
- Bai, D. and Chung, S. (1992). Optimal design of partially accelerated life-test for exponential distribution under Type-I censoring. IEEE Transactions on Reliability, 41, 400-406. https://doi.org/10.1109/24.159807
- Khamis, I. H. (1997a). Comparison between constant and step-stress tests for Weibull models. International Journal of Quality & Reliability Management, 14, 74-81. https://doi.org/10.1108/02656719710156798
- Khamis, I. H. (1997b). Optimum M-step. step-stress design with k stress variables. Communications in Statistics, Computation and Simulation, 26, 1301-1313. https://doi.org/10.1080/03610919708813441
- Khamis, I. H. and Higgins, J. J. (1996). Optimum 3-step step-stress tests. IEEE Transactions on Reliability, 45, 341-345. https://doi.org/10.1109/24.510823
- Kim, I. H. (2006). Compound linear test plan for 3-level constant stress tests. Journal of Korean Data & Information Science Society, 17, 945-952.
- Meeker, W. Q. (1984). A comparison of accelerated life test plans for Weibull and lognormal distributions and Type I censoring. Technometrics, 26, 157-171. https://doi.org/10.1080/00401706.1984.10487941
- Meeker, W. Q. and Nelson, W. (1975). Optimum accelerated life tests for the Weibull and extreme value distribution. IEEE Transactions on Reliability, 24, 321-332.
- Moon, G. A. (2008). Step-stress accelerated life test for grouped and censored data. Journal of Korean Data & Information Science Society, 19, 697-708.
- Moon, G. A. (2012). Optimal three step stress accelerated life tests under periodic inspection and type I censoring. Journal of the Korean Data & Information Science Society, 23, 843-850. https://doi.org/10.7465/jkdi.2012.23.4.843
- Moon, G. A. and Kim, I. H. (2006). Parameter estimation of the two-parameter exponential distribution under three step-stress accelerated life test. Journal of Korean Data & Information Science Society, 17, 1375-1386.
- Moon, G. A. and Park, Y. K. (2009). Optimal step stress accelerated life tests for the exponential distribution under periodic inspection and type I censoring. Journal of the Korean Data & Information Science Society, 20, 1169-1175.