References
- Coffey D C and Ginger D S (2006) Time-resolved electrostatic force microscopy of polymer solar cells. Nat. Mater. 5, 735-740. https://doi.org/10.1038/nmat1712
- Collins L, Kilpatrick J I, Weber S A L, Tselev A, Vlassiouk I V, Ivanov I N, Jesse S, Kalinin S V, and Rodriguez B J (2013) Open loop Kelvin probe force microscopy with single and multi-frequency excitation. Nanotechnology 24, 475702. https://doi.org/10.1088/0957-4484/24/47/475702
- Ellison D J, Lee B, Podzorov V, and Frisbie C D (2011) Surface potential mapping of SAM-functionalized organic semiconductors by Kelvin probe force microscopy. Adv. Mater. 23, 502-507. https://doi.org/10.1002/adma.201003122
- Gady B, Schleef D, Reifenberer R, Rimai D, and DeMejo L P (1996) Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substrate. Phys. Rev. B 53, 8065-8070. https://doi.org/10.1103/PhysRevB.53.8065
- Girard P (2001) Electrostatic force microscopy: principles and some applications to semiconductors. Nanotechnology 12, 485-490. https://doi.org/10.1088/0957-4484/12/4/321
- Hong J, Kim Y, Paik H, No K, and Lukes J R (2009) The effect of nitrogen incorporation on surface properties of silicon oxynitride films. Phys. Rapid Res. Lett. 3, 25-27.
- Jacobs H O, Knapp H F, and Stemmer A (1999) Practical aspects of Kelvin probe force microscopy. Rev. Sci. Instrum. 70, 1756-1760. https://doi.org/10.1063/1.1149664
- Kalinin S V and Bonnell D A (2001) Local potential and polarization screening on ferroelectric surfaces. Phys. Rev. B 63, 125411. https://doi.org/10.1103/PhysRevB.63.125411
- Kalinin S V and Bonnell D A (2004) Screening phenomena on oxide surfaces and its implications for local electrostatic and transport measurements. Nano Lett. 4, 555-560. https://doi.org/10.1021/nl0350837
- Kelvin L (1898) Contact electricity of metals. Philos. Mag. 46, 82-120. https://doi.org/10.1080/14786449808621172
- Kim Y, Park M, Buhlmann S, Hong S, Kim Y K, Ko H, Kim J, and No K (2010) Effect of local surface potential distribution on its relaxation in polycrystalline ferroelectric films. J. Appl. Phys. 107, 054103. https://doi.org/10.1063/1.3290953
- Li G Y, Mao B, Lan F, and Liu L M (2012) Practical aspects of single-pass scan Kelvin probe force microscopy. Rev. Sci. Instrum. 83, 113701. https://doi.org/10.1063/1.4761922
- Nonnenmacher M, O'Boyle M P, and Wickramasinghe H K (1991) Kelvin probe force microscopy. Appl. Phys. Lett. 58, 2921-2923. https://doi.org/10.1063/1.105227
- Palermo V, Palma M, and Samori P (2006) Electronic characterization of organic thin films by Kelvin probe force microscopy. Adv. Mater. 18, 145-164. https://doi.org/10.1002/adma.200501394
- Sadewasser S (2012) Experimental technique and working modes. In: Kelvin Probe Force Microscopy, ed. Glatzel T, pp. 7-24, (Springer, Heidelberg).
- Takahashi T, Kawamukai T, Ono S, Noda T, and Sakaki H (2000) Kelvin probe force microscopy on InAs thin films on (110) GaAs substrates. Jpn. J. Appl. Phys. 39, 3721-3723. https://doi.org/10.1143/JJAP.39.3721
- Takeuchi O, Ohrai Y, Yoshida S, and Shigekawa H (2007) Kelvin probe force microscopy without bias-voltage feedback. Jpn. J. Appl. Phys. 46, 5626-5630. https://doi.org/10.1143/JJAP.46.5626
- Vasudevan R, Marincel D, Jesse S, Kim Y, Kumar A, Kalinin S, and Trolier-Mckinstry S (2013) Polarization dynamics in ferroelectric capacitors: local perspective on emergent collective behavior and memory effects. Adv. Funct. Mater. 23, 2490-2508. https://doi.org/10.1002/adfm.201203422
- Wu Y and Shannon M A (2006) ac driving amplitude dependent systematic error in scanning Kelvin probe microscope measurements: detection and correction. Rev. Sci. Instrum. 77, 043711. https://doi.org/10.1063/1.2195104
-
Yoo H, Bae C, Yang Y, Lee S, Kim M, Kim Y, and Shin H (2014) Spatial charge separation in asymmetric nanostructure of Au nanoparticle on
$TiO_2$ nanotube by light-induced surface potential imaging. Nano Lett. 14, 4413-4417. https://doi.org/10.1021/nl501381a