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피인용 문헌
- A monitoring method of semiconductor manufacturing processes using Internet of Things–based big data analysis vol.13, pp.7, 2017, https://doi.org/10.1177/1550147717721810
- A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes vol.30, pp.2, 2017, https://doi.org/10.1109/TSM.2017.2676245