전자공학회논문지 (Journal of the Institute of Electronics and Information Engineers)

  • 제51권1호
  • /
  • Pages.79-89
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  • 2014
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  • 2287-5026(pISSN)
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  • 2288-159X(eISSN)
대한전자공학회 (The Institute of Electronics and Information Engineers)
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NAND Flash Memory Pattern Test를 위한 PMBIST

PMBIST for NAND Flash Memory Pattern Test

  • 김태환 (숭실대학교 컴퓨터학과) ;
  • 장훈 (숭실대학교 컴퓨터학과)
  • 투고 : 2013.07.30
  • 발행 : 2014.01.25
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초록

최근 새롭게 보급되는 휴대기기(스마트폰, 울트라북, 태블릿 PC)로 인하여 고용량과 빠른 속도를 원하는 소비자가 증가하고 있다. 이에 따라 Flash Memory의 수요도 지속적으로 증가하고 있다. Flash Memory는 NAND형과 NOR형으로 구분되어 있다. NAND형 Flash Memory는 NOR형 Flash Memory에 비해 속도는 느리지만 가격이 저렴하다. 그렇기 때문에 NAND형 Flash Memory는 Mobile 시장에서 많이 사용되어지고 있다. 그래서 Flash Memory Test를 위한 Fault 검출은 메우 중요하다. 본 논문에서는 Fault 검출 향상을 위한 NAND형 Flash Memory의 Pattern Test를 위한 PMBIST를 제안한다.

It has been an increase in consumers who want a high-capacity and fast speed by the newly diffused mobile device(Smart phones, Ultra books, Tablet PC). As a result, the demand for Flash Memory is constantly increasing. Flash Memory is separated by a NAND-type and NOR-type. NAND-type Flash Memory speed is slow, but price is cheaper than the NOR-type Flash Memory. For this reason, NAND-type Flash Memory is widely used in the mobile market. So Fault Detection is very important for Flash Memory Test. In this paper, Proposed PMBIST for Pattern Test of NAND-type Flash Memory improved Fault detection.

키워드

참고문헌

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