Applied Microscopy

Korean Society of Microscopy (한국현미경학회)
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Transmission Electron Microscopy Specimen Preparation for Layer-area Graphene by a Direct Transfer Method

  • Cho, Youngji (Department of Measurement & Analysis, National NanoFab Center) ;
  • Yang, Jun-Mo (Department of Measurement & Analysis, National NanoFab Center) ;
  • Lam, Do Van (Nano Mechatronics, University of Science and Technology (UST)) ;
  • Lee, Seung-Mo (Nano Mechatronics, University of Science and Technology (UST)) ;
  • Kim, Jae-Hyun (Nano Mechatronics, University of Science and Technology (UST)) ;
  • Han, Kwan-Young (OLED Module Team, Samsung Display Co., Ltd.) ;
  • Chang, Jiho (Department of Applied Science, Korea Maritime and Ocean University)
  • Received : 2014.11.05
  • Accepted : 2014.12.29
  • Published : 2014.12.30
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Abstract

We suggest a facile transmission electron microscopy (TEM) specimen preparation method for the direct (polymer-free) transfer of layer-area graphene from Cu substrates to a TEM grid. The standard (polymer-based) method and direct transfer method were by TEM, high-resolution TEM, and energy dispersive X-ray spectroscopy (EDS). The folds and crystalline particles were formed in a graphene specimen by the standard method, while the graphene specimen by the direct method with a new etchant solution exhibited clean and full coverage of the graphene surface, which reduced several wet chemical steps and accompanying mechanical stresses and avoided formation of the oxide metal.

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References

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