전자공학회논문지 (Journal of the Institute of Electronics and Information Engineers)

대한전자공학회 (The Institute of Electronics and Information Engineers)
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TLC NAND-형 플래시 메모리 내장 자체테스트

TLC NAND-type Flash Memory Built-in Self Test

  • 김진완 (숭실대학교 컴퓨터학부) ;
  • 장훈 (숭실대학교 컴퓨터학부)
  • Kim, Jin-Wan (Department of computing, Soongsil University) ;
  • Chang, Hoon (Department of computing, Soongsil University)
  • 투고 : 2014.07.10
  • 심사 : 2014.11.30
  • 발행 : 2014.12.25
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초록

최근 스마트폰, 태블릿 PC, SSD(Solid State Drive)의 보급률 증가로 메모리 반도체 산업시장의 규모는 지속적으로 증가하고 있다. 또한 최근 SSD시장에 TLC NAND-형 플래시 메모리 제품의 출시로 인해 TLC NAND-형 플래시 메모리의 수요가 점차 증가할 것으로 예상된다. SLC NAND 플래시 메모리는 많은 연구가 진행되었지만 TLC NAND 플래시 메모리는 연구가 진행되지 않고 있다. 또한 NAND-형 플래시 메모리는 고가의 외부장비에 의존하여 테스트를 하고 있다. 따라서 본 논문은 기존에 제안된 SLC NAND 플래시 메모리와 MLC NAND 플래시 메모리 테스트 알고리즘을 TLC NAND 플래시 메모리에 맞게 알고리즘과 패턴을 수정하여 적용하고 고가의 외부 테스트 장비 없이 자체 테스트 수행이 가능한 구조를 제안한다.

Recently, the size of semiconductor industry market is constantly growing, due to the increase in diffusion of smart-phone, tablet PC and SSD(Solid State Drive). Also, it is expected that the demand for TLC NAND-type flash memory would gradually increase, with the recent release of TLC NAND-type flash memory in the SSD market. There have been a lot of studies on SLC NAND flash memory, but no research on TLC NAND flash memory has been conducted, yet. Also, a test of NAND-type flash memory is depending on a high-priced external equipment. Therefore, this study aims to suggest a structure for an autonomous test with no high-priced external test device by modifying the existing SLC NAND flash memory and MLC NAND flash memory test algorithms and patterns and applying them to TLC NAND flash memory.

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참고문헌

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