JSTS:Journal of Semiconductor Technology and Science

The Institute of Electronics and Information Engineers (대한전자공학회)
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Self-Checking Look-up Tables using Scalable Error Detection Coding (SEDC) Scheme

  • Lee, Jeong-A (School of Electronics Engineering, Kyungpook National University) ;
  • Siddiqui, Zahid Ali (School of Electronics Engineering, Kyungpook National University) ;
  • Somasundaram, Natarajan (School of Electronics Engineering, Kyungpook National University) ;
  • Lee, Jeong-Gun (School of Electronics Engineering, Kyungpook National University)
  • Received : 2013.05.23
  • Accepted : 2013.06.25
  • Published : 2013.10.31
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Abstract

In this paper, we present Self-Checking look-up-table (LUT) based on Scalable Error Detection Coding (SEDC) scheme for use in fault-tolerant reconfigurable architectures. SEDC scheme has shorter latency than any other existing coding schemes for all unidirectional error detection and the LUT execution time remains unaffected with self-checking capabilities. SEDC scheme partitions the contents of LUT into combinations of 1-, 2-, 3- and 4-bit segments and generates corresponding check codes in parallel. We show that the proposed LUT with SEDC performs better than LUT with traditional Berger as well as Partitioned Berger Coding schemes. For 32-bit data, LUT with SEDC takes 39% less area and 6.6 times faster for self-checking than LUT with traditional Berger Coding scheme.

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References

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