참고문헌
- JH. Leidecker : Electrical Failure of an Accelerator Pedal Position Sensor Caused by a Tin Whisker and Discussion of Investigative Techniques Used for Whisker Detection, Proc. 5th International Symposium on Tin Whisker, Maryland, 14, University of Maryland (2011)
- K. S. Kim : Sn Whisker Research Trend in Japan, J. Microelectron. Packag. Soc., 19-4 (2012), 7-12 (in Korean) https://doi.org/10.6117/kmeps.2012.19.4.007
- K. S. Kim, K. Hamasaki, K. J. Lee, A. Baated, K. Suganuma, M. Tsujimoto : Effects of the Sn plating structure and surface coating layer on Sn whikser growth, Proc. 19th Micro-Electronic Symposium, Fukuoka, Japan, (2009), 65-68 (in Japanese)
- K.S. Kim, K. Suganuma, Y. Yorikado, K.J. Lee, A. Baated, M. Tsujimoto : Effect of Substrate Materials on Sn Whisker Growth, J. Japan Research Institute for Advanced Copper-base Materials and Technologies, 49 (2010), 112-115 (in Japanese)
- K. S. Kim, S. S. Kim, Y. Yorikado, K. Suganuma, M. Tsujimoto, I. Yanada : .M. Brick, A.W. Pense and R.B. Gordon : Sn whisker growth on Sn plating with or without surface treatment during the room temperature exposure, J. Alloys and Compounds, 558 (2013), 125-130 https://doi.org/10.1016/j.jallcom.2013.01.051
- C. Oh, J. S. Jung, K. Y. Ku, Y. H. Yoon, U. H. Hwang, W. S. Hong : The Growth Mechanism and Mitigation Method of Sn Whiskers, Journal of KWJS, 29-4 (2011), 365-372 (in Korean) https://doi.org/10.5781/KWJS.2011.29.4.365