DOI QR코드

DOI QR Code

Effect of Fabricating Nanopatterns on GaN-Based Light Emitting Diodes by a New Way of Nanosphere Lithography

  • Received : 2012.11.21
  • Accepted : 2013.01.10
  • Published : 2013.03.27

Abstract

Nanosphere lithography is an inexpensive, simple, high-throughput nanofabrication process. NSL can be done in different ways, such as drop coating, spin coating or by means of tilted evaporation. Nitride-based light-emitting diodes (LEDs) are applied in different places, such as liquid crystal displays and traffic signals. The characteristics of gallium nitride (GaN)-based LEDs can be enhanced by fabricating nanopatterns on the top surface of the LEDs. In this work, we created differently sized (420, 320 and 140 nm) nanopatterns on the upper surfaces of GaN-based LEDs using a modified nanosphere lithography technique. This technique is quite different from conventional NSL. The characterization of the patterned GaN-based LEDs revealed a dependence on the size of the holes in the pattern created on the LED surface. The depths of the patterns were 80 nm as confirmed by AFM. Both the photoluminescence and electroluminescence intensities of the patterned LEDs were found to increase with an increase in the size of holes in the pattern. The light output power of the 420-nm hole-patterned LED was 1.16 times higher than that of a conventional LED. Moreover, the current-voltage characteristics were improved with the fabrication of differently sized patterns over the LED surface using the proposed nanosphere lithography method.

Keywords

References

  1. H. A. Atwater and A. Polman, Nat. Mater., 9, 205 (2010). https://doi.org/10.1038/nmat2629
  2. Y. K. Su, J. J. Chen, C. L. Lin, S. M. Chen, W. L. Li and C. C. Kao, J. Cryst. Growth, 311, 2973 (2009). https://doi.org/10.1016/j.jcrysgro.2009.01.055
  3. Y. K. Su, J. J. Chen, C. L. Lin, S. M. Chen, W. L. Li and C. C. Kao, Jpn. J. Appl. Phys., 47, 6706 (2008). https://doi.org/10.1143/JJAP.47.6706
  4. R. F. Aroca, R. A. Alvarez-Puebla, N. Pieczonka, S. Sanchez-Cortez and J. V. Garcia-Ramos, Adv. Colloid Interface Sci., 116, 45 (2005). https://doi.org/10.1016/j.cis.2005.04.007
  5. S. Roy and Z. Gao, Nano Today, 4, 318 (2009). https://doi.org/10.1016/j.nantod.2009.06.003
  6. C. Jeffryes, T. Gutu, J. Jiao and G. L. Rorrer, ACS Nano, 2, 2103 (2008). https://doi.org/10.1021/nn800470x
  7. C. L. Haynes and R. P. Van Duyne, J. Phys. Chem. B, 105, 5599 (2001). https://doi.org/10.1021/jp010657m
  8. H. W. Choi, C. W. Jeon, M. D. Dawson, P. R. Edwards and R. W. Martin, IEEE Photon. Tech. Lett., 15, 510 (2003). https://doi.org/10.1109/LPT.2003.809257
  9. H. W. Choi, C. W. Jeon, C. Liu, I. M. Watson, M. D. Dawson, P. R. Edwards, R. W. Martin, S. Tripathy and S. J. Chua, Appl. Phys. Lett., 86, 021101 (2005). https://doi.org/10.1063/1.1849439
  10. C. Huh, J. M. Lee, D. J. Kim, and S. J. Park, J. Appl. Phys., 92, 2248 (2002). https://doi.org/10.1063/1.1497467
  11. Y. Lee, M. Alam, J. Y. Kim, W. G. Jung and S. D. Kim, Kor. J. Mater. Res., 20, 550 (2010) (in Korean). https://doi.org/10.3740/MRSK.2010.20.10.550
  12. C. Cong, W. C. Junus, Z. Shen and T. Yu, Nanoscale Res. Lett., 4, 1324 (2009). https://doi.org/10.1007/s11671-009-9400-0