Journal of the Institute of Electronics and Information Engineers (전자공학회논문지)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Edge Detection Method using Modified Coefficient Masks

변형된 계수 마스크를 이용한 에지 검출 방법

  • Lee, Chang-Young (Dept. of Control & Instrumentation Eng., Pukyong National University) ;
  • Chung, Suk-Moon (Dept. of Electrical & Electronic Eng., ROKNA) ;
  • Kim, Nam-Ho (Dept. of Control & Instrumentation Eng., Pukyong National University)
  • 이창영 (부경대학교 제어계측공학과) ;
  • 정석문 (해군사관학교 전기전자공학과) ;
  • 김남호 (부경대학교 제어계측공학과)
  • Received : 2013.02.15
  • Published : 2013.05.25
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Abstract

The performances of previous edge detection methods such as Sobel, Prewitt, and LoG(Laplacian of Gaussian) are insufficient for images degraded in AWGN(additive white Gaussian noise). Therefore, in this paper, we proposed an edge detection algorithm using a modified coefficient masks with gradient masks and distance weight mask. In order to confirm and verify the performance of the proposed algorithm, we simulated and compared proposed algorithm to conventional methods on various standard images added AWGN with a standard deviation ${\sigma}$=15, 30 and proposed algorithm shows superior edge detection characteristics in processed images.

에지를 검출하기 위한 기존의 방법에는 Sobel, Prewitt, LoG(Laplacian of Gaussian) 등이 있으며, 이러한 방법들은 AWGN(additive white Gaussian noise)이 첨가된 영상에서 에지 검출 특성이 다소 미흡하다. 따라서 본 논문에서는 기울기 및 거리 가중치 마스크가 적용된 변형된 계수 마스크를 이용한 에지 검출 알고리즘을 제안하였다. 제안된 알고리즘의 성능을 확인 및 검증하기 위하여, 표준편차 ${\sigma}$=15, 30의 AWGN이 첨가된 여러 표준 영상으로 기존의 방법과 비교 및 시뮬레이션하였으며, 처리된 영상에서 제안한 알고리즘은 에지 검출 특성이 우수하였다.

Keywords

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