References
- J. S. Anderson, "A magnification method of measuring focal length," Trans. Opt. Soc. 33, 55-62 (1931). https://doi.org/10.1088/1475-4878/33/2/302
- J. C. Wyant, "Measurement of paraxial properties of optical systems," http://www.optics.arizona.edu/opti510l/references/WyantParaxialProperties.pdf.
- A. A. Magill, "Variation in distortion with magnification," J. Res. Nat. Bur. Stand. 54, 135-142, Research Paper 2574 (1954).
- S. Lee, R. Roberts, and J. H. Burge, "Self-consistent way to determine relative distortion of axial symmetric lens systems," Appl. Opt. 51, 588-593 (2012). https://doi.org/10.1364/AO.51.000588
- W. T. Welford, Aberrations of Optical Systems (Adam Hilger, Bristol, Great Britain, 1986).
- O. Faugeras, Three-dimensional Computer Vision: A Geometric Viewpoint (MIT Press, 1993).
- Matlab, http://www.mathworks.com/products/matlab/.
- ZEMAX Optical Design Program, ZEMAX Development Corporation, www.zemax.com.
- CVI Melles Griot, http://www.cvimellesgriot.com/Products/ Laser-Quality-BK7-Bi-Convex-Lenses.aspx. The center thickness and radius of curvature were actually measured with Trioptics instrument.
- B. Kim and S. Lee, "Determination of Gaussian image plane location by using transverse magnification," in preparation.
- B. Kim and S. Lee, "Determination of longitudinal chromatic aberration by using transverse magnification," in preparation.
Cited by
- Alternative Description for Gaussian Image Plane vol.19, pp.2, 2015, https://doi.org/10.3807/JOSK.2015.19.2.144
- Accurate determination of distortion for smartphone cameras vol.53, pp.29, 2014, https://doi.org/10.1364/AO.53.0000H1