한국전자파학회논문지 (The Journal of Korean Institute of Electromagnetic Engineering and Science)

  • 제24권3호
  • /
  • Pages.253-258
  • /
  • 2013
  • /
  • 1226-3133(pISSN)
  • /
  • 2288-226X(eISSN)
한국전자파학회 (The Korean Institute of Electromagnetic Engineering and Science)
권호 표지
DOI QR코드

DOI QR Code

자유공간 물질상수 측정법을 이용한 W-Band 유전율 측정

W-Band Permittivity Measurements Using a Free-Space Material Measurement Technique

  • 강진섭 (한국표준과학연구원 기반표준본부 전자파센터) ;
  • 김정환 (한국표준과학연구원 기반표준본부 전자파센터) ;
  • 조치현 (한국표준과학연구원 기반표준본부 전자파센터) ;
  • 김대찬 (한국표준과학연구원 기반표준본부 전자파센터)
  • Kang, Jin-Seob (Center for Electromagnetic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS)) ;
  • Kim, Jeong-Hwan (Center for Electromagnetic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS)) ;
  • Cho, Chihyun (Center for Electromagnetic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS)) ;
  • Kim, Dae-Chan (Center for Electromagnetic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS))
  • 투고 : 2012.11.30
  • 심사 : 2013.03.11
  • 발행 : 2013.03.31
PDF 다운로드
⟨ 이전 논문 다음 논문 ⟩

초록

본 논문에서는 W-band(75~110 GHz) 자유공간 물질상수 측정법을 논의하였다. 우선 자유공간에서 주위 환경에 영향을 덜 받으면서 피측정물(MUT: Material Under Test)에 의한 산란계수를 정확하게 측정하기 위한 W-band quasi-optical 기술 기반 자유공간 물질상수 측정시스템을 논의하고, 관련 측정시스템의 GRL(Gated Reflect Line) 교정법을 기술하였다. 그리고 공기를 피측정물로 하여 제안된 측정법의 타당성을 보이고, 두께가 1.1 mm, 2 mm, 2.75 mm, 5 mm인 arystal 평판에 대한 측정 결과를 제시하였다.

In this paper, a free-space material measurement technique is discussed in W-band(75~110 GHz). For the accurate measurement of S-parameters of an MUT(Material Under Test) in free space, a W-band quasi-optical free-space material measurement system, less affected by the measurement environments, is discussed, and GRL(Gated Reflect Line) method for calibrating the measurement system is described. Proposed technique is verified for 'Air' and measurement results for arystal plates of thickness 1.1 mm, 2 mm, 2.75 mm and 5 mm are also shown.

키워드

참고문헌

  1. A guide to characterization of dielectric materials at RF and microwave frequencies, National Physical Laboratory(NPL), Sep. 2003.
  2. Free Space Materials Measurement Seminar, Agilent Technologies, Jun. 2005.
  3. NIST Technical Note 1355-R, 1993.

피인용 문헌

  1. Measuring the carrier lifetime by using a quasi-optical millimeter- and THz-wave system vol.110, pp.7, 2017, https://doi.org/10.1063/1.4976315
  2. Design of 77-GHz Automotive Radar Frontend Modules vol.25, pp.4, 2014, https://doi.org/10.5515/KJKIEES.2014.25.4.487
  3. Specular Reflectance Measurements of Dielectric Plates in Millimeter Frequency Range vol.18, pp.2, 2018, https://doi.org/10.26866/jees.2018.18.2.78