마이크로전자및패키징학회지 (Journal of the Microelectronics and Packaging Society)

  • 제20권3호
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  • Pages.59-62
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  • 2013
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  • 1226-9360(pISSN)
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  • 2287-7525(eISSN)
한국마이크로전자및패키징학회 (The Korean Microelectronics and Packaging Society)
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강력한 임의진동 하에서 PBGA 패키지의 실험적 신뢰성 검증

Experimental Assessment of PBGA Packaging Reliability under Strong Random Vibrations

  • 김영국 (인하대학교 공과대학 자율전공학부) ;
  • 황도순 (한국항공우주연구원)
  • Kim, Yeong K. (Department of Convergence Engineering and Management, Inha University) ;
  • Hwang, Dosoon (Korea Aerospace Research Institute)
  • 투고 : 2013.09.16
  • 심사 : 2013.09.27
  • 발행 : 2013.09.30
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초록

Plastic ball grid array (PBGA)에 대한 강력한 임의 진동에서의 신뢰성을 실험적으로 검증하였다. 실험시편을 만들기 위해 데이지 체인이 형성된 PCB에 칩을 실장시킨 후 그중 절반은 underfill 공정을 거쳤다. 임의 진동 프로파일은 인공위성 전자장비의 신뢰성 검증에서 사용되는 두 종류의 진동 수준, 즉 판정시험 (acceptance level) 및 합격시험(qualification level)을 사용하였으며 각각의 power spectrum density는 22.7 Grms와 32.1 Grms였다. 실험후 underfill과 관계없이 모든 샘플에서 솔더의 균열이 발생되지 않았으며, 차후 항공 및 우주용 전자장비를 대치할 수 있는 패키징 구조의 가능성을 보여 줬다.

Experimental analyses on the solder joint reliability of plastic ball grid array under harsh random vibration were presented. The chips were assembled on the daisy chained circuit boards for the test samples preparation, half of which were processed for underfill to investigate the underfill effects on the solder failures. Acceptance and qualification levels were applied for the solder failure tests, and the overall controlled RMS of the power spectrum densities of the steps were 22.7 Grms and 32.1 Grms, respectively. It was found that the samples survived without any solder failure during the tests, demonstrating the robustness of the packaging structure for potential avionics and space applications.

키워드

참고문헌

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