JSTS:Journal of Semiconductor Technology and Science

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Performance Investigation of Insulated Shallow Extension Silicon On Nothing (ISE-SON) MOSFET for Low Volatge Digital Applications

  • Kumari, Vandana (Semiconductor Device Research Laboratory, Department of Electronics Science, University of Delhi) ;
  • Saxena, Manoj (Department of Electronics, Deen Dayal Upadhyaya College, University of Delhi) ;
  • Gupta, R.S. (Department of Electronics and Communication Engineering, Maharaja Agrasen Institute of Technology) ;
  • Gupta, Mridula (Semiconductor Device Research Laboratory, Department of Electronics Science, University of Delhi)
  • Received : 2012.12.13
  • Accepted : 2013.08.11
  • Published : 2013.12.31
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Abstract

The circuit level implementation of nanoscale Insulated Shallow Extension Silicon On Nothing (ISE-SON) MOSFET has been investigated and compared with the other conventional devices i.e. Insulated Shallow Extension (ISE) and Silicon On Nothing (SON) using the ATLAS 3D device simulator. It can be observed that ISE-SON based inverter shows better performance in terms of Voltage Transfer Characteristics, noise margin, switching current, inverter gain and propagation delay. The reliability issues of the various devices in terms of supply voltage, temperature and channel length variation has also been studied in the present work. Logic circuits (such as NAND and NOR gate) and ring oscillator are also implemented using different architectures to illustrate the capabilities of ISE-SON architecture for high speed logic circuits as compared to other devices. Results also illustrates that ISE-SON is much more temperature resistant than SON and ISE MOSFET. Hence, ISE-SON enables more aggressive device scaling for low-voltage applications.

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References

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