JSTS:Journal of Semiconductor Technology and Science

The Institute of Electronics and Information Engineers (대한전자공학회)
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Analytical Eye-Diagram Determination for the Efficient and Accurate Signal Integrity Verification of Coupled Interconnect Lines

  • Lee, Minji (Department of Electronics and Communication Engineering, Hanyang University) ;
  • Kim, Dongchul (Department of Electronics and Communication Engineering, Hanyang University) ;
  • Eo, Yungseon (Department of Electronics and Communication Engineering, Hanyang University)
  • Received : 2013.03.26
  • Accepted : 2013.08.11
  • Published : 2013.12.31
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Abstract

A new efficient analytical eye-diagram determination technique for coupled interconnect lines is presented. Two coupled lines are decoupled into isolated eigen modes; bit blocks for coupled lines, which are defined as a block of consecutive bits, are then represented with decoupled modes. The crosstalk effects within the bit blocks are taken into account. Thereby, the crucial input bit patterns for the worst case eye-diagram determination are modeled mathematically, including inter-symbol interference (ISI). The proposed technique shows excellent agreement with the SPICE-based simulation. Furthermore, it is very computation-time-efficient in the order of magnitude, compared with the SPICE simulation, which requires numerous pseudo-random bit sequence (PRBS) input signals.

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