Polymer Science and Technology (한국고분자학회지:고분자과학과기술)
- Volume 24 Issue 5
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- Pages.528-534
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- 2013
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- 1225-0260(pISSN)
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- 2586-1476(eISSN)
Characterization of Polymer Surfaces by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
비행시간형 이차이온질량분석(TOF-SIMS) 장비를 이용한 고분자 표면분석 및 최근동향
- Lee, Yeonhee (Advanced Analysis Center, Korea Institute of Science and Technology) ;
- Lee, Jihye (Advanced Analysis Center, Korea Institute of Science and Technology)
- Published : 2013.10.25
Abstract
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