Journal of the Korean Society for Precision Engineering (한국정밀공학회지)

Korean Society for Precision Engineering (한국정밀공학회)
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Measured Intensity Control Method of a Phase-shift Measurement Based Laser Scanner by using APD Bias Voltage Characteristic

위상 검출 방식 레이저 스캐너의 APD bias 전압 특성을 이용한 검출신호세기 제어 방법

  • Jang, Jun-Hwan (School of Mechatronics, Gwangju Institute of Science and Technology) ;
  • Yoon, Hee-Sun (Advanced Institute of Technology, Samsung Electronics) ;
  • Hwang, Sung-Ui (School of Mechatronics, Gwangju Institute of Science and Technology) ;
  • Park, Kyi-Hwan (School of Mechatronics, Gwangju Institute of Science and Technology)
  • Received : 2011.09.06
  • Accepted : 2012.07.09
  • Published : 2012.10.01
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Abstract

In the phase-shift measurement method, the distance light travels can be obtained based on the phase difference between the reference signal and the measured signal. When the object having various colors is measured, the intensity of the measured signal much varies even at the same distance, and it causes different phase delay due to wide dynamic range input to a signal processing circuit. In this work, an measured intensity control method is proposed to solve this phase delay problem.

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References

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