Tribology and Lubricants

  • 제28권2호
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  • Pages.62-69
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  • 2012
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  • 2713-8011(pISSN)
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  • 2713-802X(eISSN)
한국트라이볼로지학회 (Korean Tribology Society)
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AFM을 이용한 나노스케일 힘의 정량적 측정

Quantitative Measurement of Nano-scale Force using Atomic Force Microscopy

  • 투고 : 2012.01.25
  • 심사 : 2012.03.05
  • 발행 : 2012.04.30
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초록

Atomic force microscopy (AFM) has been widely utilized as a versatile tool not only for imaging surfaces but also for understanding nano-scale interfacial phenomena. By measuring the responses of the photo detector due to bending and torsion of the cantilever, which are caused by the interactions between the probe and the sample surface, various interfacial phenomena and properties can be explored. One of the challenges faced by AFM researchers originates in the physics of measuring the small forces that act between the probe of a force sensing cantilever and the sample. To understand the interactions between the probe and the sample quantitatively, the force calibration is essential. In this work, the procedures used to calibrate AFM instrumentation for nano-scale force measurement in normal and lateral directions are reviewed.

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참고문헌

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