참고문헌
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H. J. Kim, H. Y. Pang, and S. Y. Kim, "Determination of the refractive index and the extinction coefficient of
$TiO_{2}$ thin films by using optical methods and of the packing density variation with growth technique," Sae Mulli 37, 45-52 (1997). - R. A. Synowichi, "Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants," Thin Solid Films 313-314, 394-397 (1998). https://doi.org/10.1016/S0040-6090(97)00853-5
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- F. Wooten, Optical Properties of Solids (Academic Press, New York, USA, 1972), Chapter 3.
피인용 문헌
- Expressions for Ellipsometric Constants of Samples Covered with Two Thick Incoherent Films vol.24, pp.2, 2013, https://doi.org/10.3807/KJOP.2013.24.2.092
- Precise Measurement of the Ultrasmall Optical Anisotropy of Rubbed Polyimide Using an Improved Reflection Ellipsometer vol.26, pp.4, 2015, https://doi.org/10.3807/KJOP.2015.26.4.195
- Comparison of Misalignment and Retardation Errors of Dual Rotating Quarter-Wave Plates in Muller-Matrix Ellipsometry vol.25, pp.5, 2014, https://doi.org/10.3807/KJOP.2014.25.5.262
- Systematic Error Correction in Dual-Rotating Quarter-Wave Plate Ellipsometry using Overestimated Optimization Method vol.25, pp.1, 2014, https://doi.org/10.3807/KJOP.2014.25.1.029