References
- Bai, D. S., Kim, M. S. and Lee, S. H. (1989). Optimum simple step-stress accelerated life tests with censoring. IEEE Transactions on Reliability, 38, 528-532. https://doi.org/10.1109/24.46476
- Bai, D. S. and Chung, S. W. (1992). Optimal design of partially accelerated life-test for exponential distri- bution under type-I censoring. IEEE Transactions on Reliability, 41, 400-406. https://doi.org/10.1109/24.159807
- DeGroot, M. H. and Goel, P. K. (1979). Bayesian estimation and optimal designs in partially accelerated life testing. Naval Research Logistics Quarterly, 26, 223-235. https://doi.org/10.1002/nav.3800260204
- Kahn, H. D. (1979). Least square estimation for the inverse power law for accelerated life tests. Applied Statistics, 28, 40-46. https://doi.org/10.2307/2346809
- Khamis, I. H. and Higgins, J. J. (1996). Optimum 3-step step-stress tests. IEEE Transactions on Reliability, 45, 341-345. https://doi.org/10.1109/24.510823
- Kim, I. H. (2006). Compound linear test plan for 3-level constant stress tests. Journal of Korean Data & Information Science Society, 17, 945-952.
- Lawless, J. F. (1982). Statistical models and methods for lifetime data, John Wiley & Sons, New York.
- Meeker, W. Q. and Nelson, W. (1975). Optimum accelerated life tests for the Weibull and extreme value distribution. IEEE Transactions on Reliability, 24, 321-332.
- Meeker, W. Q. (1984). A comparison of accelerated life test plans for Weibull and lognormal distributions and type I censoring. Technometrics, 26, 157-171. https://doi.org/10.2307/1268110
- Moon, G. A. and Kim, I. H. (2006). Parameter estimation of the two-parameter exponential distribution under three step-stress accelerated life test. Journal of Korean Data & Information Science Society, 17, 1375-1386.
- Moon, G. A. (2008). Step-stress accelerated life test for grouped and censored data. Journal of Korean Data & Information Science Society, 19, 697-708.
- Moon, G. A. and Park, Y. K. (2009). Optimal step stress accelerated life tests for the exponential distribution under periodic inspection and type I censoring. Journal of Korean Data & Information Science Society, 20, 1169-1175.
- Nelson, W. and Miller, R. (1983). Optimum simple step-stress plans for accelerated testing. IEEE Transactions on Reliability, 32, 59-65.
- Tang, L. C., Sun, Y. S., Goh, T. N. and Ong, H. L. (1996). Analysis of step-stress accelerated life-test data: A new approach. IEEE Transactions on Reliability, 45, 69-74. https://doi.org/10.1109/24.488919
- Teng, S. W. and Yeo, K. P. (2002). A least-square approach to analyzing life-stress relationship in step-stress accelerated life tests. IEEE Transactions on Reliability, 51, 177-182. https://doi.org/10.1109/TR.2002.1011523