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A Study on the Effectiveness of Ultra-FRFET for the HV-BLU System in LCD TVs

LCD TV HV-BLU 시스템에 대한 Ultra-FRFET의 유효성에 관한 연구

  • 이상택 (한양대학교 전자전기제어계측공학과) ;
  • 연재을 (페어차일드 코리아 HV PCIA) ;
  • 조규민 (유한대학 정보통신학과) ;
  • 김희준 (한양대학교 전자.컴퓨터공학부)
  • Received : 2010.03.09
  • Accepted : 2010.07.08
  • Published : 2010.08.01

Abstract

This paper introduces a newly improved Ultra-FRFET that has much better reverse recovery characteristic than that of the typical MOSFET and presents its effectiveness in the HV-BLU system of LCD TVs. The reverse recovery time, $T_{rr}$ of Ultra-FRFET is shorter than 40nsec and the peak value of reverse current, $i_{rr}$ is also much smaller compared to the typical MOSFET's, which are sufficient to prevent the MOSFET’s failures without additional FRDs and diodes in HV-BLU system with a half-bridge resonant inverter topology worked by PWM method. In order to verify the validity, the loss analysis and the implementation results in cases when both the conventional solution using typical MOSFETs with additional FRDs and a new solution using Ultra-FRFETs are applied to a HV-BLU of 40" LCD TV are presented. As a result, the effectiveness of Ultra-FRFET was verified and the results are presented in this paper.

Keywords

References

  1. Chang-Gyum Kim; Kyu-Chan Lee; Cho, B.H., "Modeling of CCFL using lamp delay and stability analysis of backlight inverter for large size LCD TV," APEC2005, pp1751-1757, Mar. 2005.
  2. Blackburn, D.L, "Power MOSFET failure revisited," PESC '88, pp681-688, Apr., 1988.
  3. Singh, P, "Power MOSFET failure mechanisms," INTELEC 2004. pp499-502, Sep. 2004.
  4. Jung, Jeesung; Huang, Alex Q.; Li, Xuening, "Analysis of the MOSFET Failure In a Junction-Isolated Power Integrated Circuit," ISPSD'07. pp249-252, May 2007.
  5. Cester, A.; Paccagnella, A.; Ghidini, G.; Deleonibus, S.; Guegan, G., "Collapse of MOSFET drain current after soft breakdown," IEEE Transactions on Power electronics, Vol 4, pp63-72, Mar.2004.
  6. Busatto, G.; Fioretto, O.; Patti, A., "Nondestructive testing of power MOSFET's failures during reverse recovery of drain-source diode," PESC96, pp593-599, June 1996.
  7. Fiel, A.; Wu, T, "MOSFET failure modes in the zero-voltage-switched full-bridge switching mode power supply applications," APEC2001, pp1247-1252, Mar. 2001.
  8. Aigner, H.; Dierberger, K.; Grafham, D., "Improving the full-bridge phase-shift ZVT converter for failure-free operation under extreme conditions in welding and similar applications," Industry Applications Conference, pp1341-1348, Oct., 1998.