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Delay Time Reliability of Analog and Digital Delay Elements for Time-to-Digital Converter

  • Choi, Jin-Ho (Department of Embedded IT, Pusan University of Foreign Studies)
  • Received : 2010.01.11
  • Accepted : 2010.01.26
  • Published : 2010.02.28

Abstract

In this paper, the delay times were evaluated to develop highly reliable time-to-digital converter(TDC) in analog and digital delay element structures. The delay element can be designed by using current source or inverter. In case of using inverter, the number of inverter has to be controlled to adjust the delay time. And in case of using current source, the current for charging and discharging is controlled. When the current source is used the delay time of the delay element is not sensitive with varying the channel width of CMOS. However, when the inverter is used the delay time is directly related to the channel width of CMOS. Therefore to obtain good reliability in TDC circuit the delay element using current source is more stable compared to inverter in the viewpoint of the variation of fabrication process.

Keywords

References

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