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A Study on the Tribolayer using Focused Ion Beam (FIB)

FIB를 이용한 트라이보층에 대한 연구

  • Kim, Hong-Jin (Department of Materials Science and Engineering, The Ohio State University)
  • 김홍진 (오하이오 주립대학교 재료공학과)
  • Received : 2010.01.23
  • Accepted : 2010.03.02
  • Published : 2010.04.30

Abstract

Focused Ion Beam (FIB) has been used for site-specific TEM sample preparation and small scale fabrication. Moreover, analysis on the surface microstructure and phase distribution is possible by ion channeling contrast of FIB with high resolution. This paper describes FIB applications and deformed surface structure induced by sliding. The effect of FIB process on the surface damage was explored as well. The sliding experiments were conducted using high purity aluminum and OFHC(Oxygen-Free High Conductivity) copper. The counterpart material was steel. Pin-on-disk, Rotational Barrel Gas Gun and Explosively Driven Friction Tester were used for the sliding experiments in order to investigate the velocity effect on the microstructural change. From the FIB analysis, it is revealed that ion channeling contrast of FIB has better resolution than SEM and the tribolayer is composed of nanocrystalline structures. And the thickness of tribolayer was constant regardless of sliding velocities.

Keywords

References

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