Industrial Engineering and Management Systems

  • 제9권1호
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  • Pages.54-59
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  • 2010
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  • 1598-7248(pISSN)
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  • 2234-6473(eISSN)
대한산업공학회 (Korean Institute of Industrial Engineers)
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A Two-Plan Sampling System for Life Testing Under Weibull Distribution

  • Aslam, Muhammad (Department of Statistics, Forman Christian College University) ;
  • Balamurali, Saminathan (Department of Mathematics, Kalasalingam University) ;
  • Jun, Chi-Hyuck (Department of Industrial and Management Engineering, Pohang University of Science and Technology) ;
  • Ahmad, Munir (Department of Statistics, National College of Business Administration & Economics)
  • 투고 : 2009.07.27
  • 심사 : 2010.01.20
  • 발행 : 2010.03.01
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초록

A two-plan sampling system is proposed for a failure-censored life testing when the lifetime follows a Weibull distribution with known shape parameter. The proposed sampling system is based on a switching rule, for switching between the tightened and the normal inspection levels when lots are submitted for inspection in the order of production or in some other systematic way. The design parameters of the proposed sampling system are determined by the two-point approach considering the producer's risks and the consumer's at the specified acceptable reliability level and the lot tolerance reliability level, respectively. It has been observed that the proposed system requires only a single failure for the observation.

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참고문헌

  1. Balamurali, S. and Jun, C-H. (2009), Designing of a variables two plan system by minimizing the average sample number, Journal of Applied Statistics, 36, 1159-1172. https://doi.org/10.1080/02664760802562514
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  7. Muthuraj, D. and Senthilkumar, D. (2006), Designing and construction of tightened-normal-tightened variables sampling scheme, Journal of Applied Statistics, 33, 101-111. https://doi.org/10.1080/02664760500389582
  8. Schneider, H. (1989), Failure-censored variables-sampling plans for lognormal and Weibull distributions, Technometrics, 31, 199-206. https://doi.org/10.2307/1268817
  9. Soundararajan, V. and Vijayaraghavan, R. (1990), Construction and Selection of Tightened-Normal-Tightened (TNT) Plans, Journal of Quality Technology, 22, 146-153.
  10. Stephens, K. S. and Larson, K. E. (1967), An evaluation of the MIL-STD 105D system of sampling plans, Industrial Quality Control, 23, 310-319.
  11. Vijayaraghavan, R. and Soundararajan, V. (1996), Procedures and tables for the selection of tightenednormal- tightened (TNT(n; $c_1$, $c_2$)) sampling schemes, Journal of Applied Statistics, 23, 69-79. https://doi.org/10.1080/02664769624369

피인용 문헌

  1. Attribute Control Charts for the Weibull Distribution under Truncated Life Tests vol.27, pp.3, 2015, https://doi.org/10.1080/08982112.2015.1017649
  2. Design of a Quick Switching Sampling System Based on the Coefficient of Variation vol.6, pp.4, 2018, https://doi.org/10.3390/technologies6040098
  3. Tightened-Normal-Tightened Group Acceptance Sampling Plan for Assuring Percentile Life vol.11, pp.4, 2010, https://doi.org/10.7232/iems.2012.11.4.390
  4. Parameter Estimation and Applications of the Weibull Distribution for Strength Data of Glass Fiber vol.2021, pp.None, 2010, https://doi.org/10.1155/2021/9175170