Fabrication of Nb SQUID on an Ultra-sensitive Cantilever

Nb SQUID가 탑재된 초고감도 캔티레버 제작

  • Published : 2009.10.30

Abstract

Superconducting quantum phenomena are getting attention from the field of metrology area. Following its first successful application of Josephson effect to voltage standard, piconewton force standard was suggested as a candidate for the next application of superconducting quantum effects in metrology. It is predicted that a micron-sized superconducting Nb ring in a strong magnetic field gradient generates a quantized force of the order of sub-piconewtons. In this work, we studied the design and fabrication of Nb superconducting quantum interference device (SQUID) on an ultra-thin silicon cantilever. The Nb SQUID and electrodes were structured on a silicon-on-insulator (SOI) wafer by dc magnetron sputtering and lift-off lithography. Using the resulting SOI wafer, we fabricated V-shaped and parallel-beam cantilevers, each with a $30-{\mu}m$-wide paddle; the length, width, and thickness of each cantilever arm were typically $440{\mu}m,\;4.5{\mu}m$, and $0.34{\mu}m$, respectively. However, the cantilevers underwent bending, a technical difficulty commonly encountered during the fabrication of electrical circuits on ultra-soft mechanical substrates. In order to circumvent this difficulty, we controlled the Ar pressure during Nb sputtering to minimize the intrinsic stress in the Nb film and studied the effect of residual stress on the resultant device.

Keywords

References

  1. J. Kehrbusch, E. A. Ilin, M. Hullin, and E. Oesterschulze, “High frequency columnar silicon microresonators for mass detection”, Appl. Phys. Lett., vol.93, pp.023102 (2008). https://doi.org/10.1063/1.2957653
  2. Bornschologl, T., and Rief, M., “Single Molecule Unzipping of Coiled Coils: Sequence Resolved Stability Profiles”, Phys. Rev. Lett. Vol.96, pp.118102 (2006). https://doi.org/10.1103/PhysRevLett.96.118102
  3. N. A. Burnham, X. Chen, C. S. Hodges, G. A. Matei, E. J. Thoreson, C. J. Roberts, M. C. Davies and S. J. B. Tendler, “Comparison of calibration methods for atomic-force microscopy cantilevers”, Nanotechnology, vol.14, pp.1-6 (2003). https://doi.org/10.1088/0957-4484/14/1/301
  4. J. H. Choi, M. S. Kim, and Y. K. Park, “Quantum-based mechanical force realization in piconewton range”, Appl. Phys. Lett., vol. 90, pp. 073117 (2007). https://doi.org/10.1063/1.2591398
  5. J. H. Choi, Y. W. Kim, K. C. Lee, Y. K. Park, H. Y. Lee, H. K. Song, “Cantilever Devices for Flux Quantum-based Force Generation”, Journal of the Korean Society of Precision Engineering, vol. 25, pp.103-104 (2008).
  6. S.-G. Lee, Y. W. Kim, J.-H. Choi, M. Y. Kim, “Control Schemes of Quantum-Based Pico-Newton Force Measurement”, IEEE Trans. Appl. Supercon., vol. 19, pp. 757-760 (2009). https://doi.org/10.1109/TASC.2009.2019541
  7. Y. W. Kim, Y. H. Kahng, J.-H. Choi,S.-G. Lee, “Critical Properties of Submicrometer-Patterned Nb Thin Film”, IEEE Trans. Appl. Supercon., vol. 19, pp. 2649-2652 (2009). https://doi.org/10.1109/TASC.2009.2019099
  8. E. H. Brandt and J. R. Clem, “Superconducting thin rings with finite penetration depth.”, Phys. Rev. B vol. 69. pp. 184509 (2004). https://doi.org/10.1103/PhysRevB.69.184509
  9. John Elie Sader, “Parallel beam approximation for V-shaped atomic force microscope cantilevers.”, Rev. Sci. Instrum. vol. 66, pp. 9 (1995).
  10. Max Ti-Kuang Hou and Rongshun Chen, “A new residual stress measurement method using ultra-wide micromachined bilayer cantilevers”, J. Micromech. Microeng. vol. 14, pp. 490-496 (2004). https://doi.org/10.1088/0960-1317/14/4/008
  11. B. S. Berry and W. C. Pritchet, “Internal stress and internal friction in thin-layer microelectronic materials”, J. Appl. Phys. vol. 67, pp. 3661 (1990). https://doi.org/10.1063/1.345321