Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Analytical Expressions for Breakdown Voltage and Specific On-Resistance of 6H-SiC PN Diodes

6H-SiC PN 다이오드의 항복전압과 온-저항을 위한 해석적 표현

  • Chung, Yong-Sung (Department of Internet Information, Doowon Technical College)
  • 정용성 (두원공과대학 인터넷정보과)
  • Published : 2009.06.25
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Abstract

Analytical expressions for breakdown voltage and specific on-resistance of 6H-SiC PN diodes have been derived successfully by extracting an effective ionization coefficient from ionization coefficients for electron and hole in 6H-SiC. The breakdown voltages induced from our analytical model are compared with experimental results. The variation of specific on-resistance as a function of doping concentration is also compared with the one reported previously. Good fits with experimental results are found for the breakdown voltage within 10% in error for the doping concentration in the range of $10^{15}{\sim}10^{18}cm^{-3}$. The analytic results show good agreement with the numerical data for the specific on-resistance in the region of $5{\times}10^{15}{\sim}10^{16}cm^{-3}$.

6H-SiC 전자 및 정공의 이온화계수로부터 유효이온화계수를 추출하여 6H-SiC PN 다이오드의 항복전압과 온-저항을 위한 해석적 표현식을 유도하였다. 해석적 모형으로부터 구한 항복전압을 $10^{15}{\sim}10^{18}\;cm^{-3}$의 도핑 농도 범위에서 실험 결과와 비교하여 10% 이내의 오차로 일치하였고, 농도 함수의 온-저항의 해석적 결과도 $5{\times}10^{15}{\sim}10^{16}\;cm^{-3}$의 범위에서 이미 발표된 수치적 결과와 매우 잘 일치하였다.

Keywords

References

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