Characteristic Analysis of Band Width Based on Rugate Porous Silicon Containing Photonic Nanocrystal

광 결정의 나노 구조를 갖는 Rugate 다공성 실리콘의 반치폭 값에 대한 특성 분석

Photonic crystals containing multiple rugate structure are prepared by electrochemical etchings. Typically etched rugate PSi prepared in this study. Etching is carried out in a Teflon cell by using a two-electrode configuration with a Pt mesh counter electrode. They exhibit sharp photonic band gaps in the optical reflectivity spectrum. This reflectivity can be tuned to appear anywhere in the visible to near-infrared spectral range, depending on the programmed etch waveform. We study the method of full width half maxima and reflectivity index control by using amplitude.