Textile Coloration and Finishing (한국염색가공학회지)

The Korean Society of Dyers and Finishers (한국염색가공학회)
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A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform

웨이블릿 다해상도 분석에 의한 디지털 이미지 결점 검출 알고리즘

  • Kim, Kyung-Joon (Department of Organic Materials and Fiber Engineering, Soongsil University) ;
  • Lee, Chang-Hwan (Department of Organic Materials and Fiber Engineering, Soongsil University) ;
  • Kim, Joo-Yong (Department of Organic Materials and Fiber Engineering, Soongsil University)
  • 김경준 (숭실대학교 유기신소재.파이버공학과) ;
  • 이창환 (숭실대학교 유기신소재.파이버공학과) ;
  • 김주용 (숭실대학교 유기신소재.파이버공학과)
  • Published : 2009.02.27
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Abstract

A real-time inspection system has been developed by combining CCD based image processing algorithm and a standard lighting equipment. The system was tested for defective fabrics showing nozzle contact scratch marks, which were one of the frequently occurring defects. Multi-resolution analysis(MRA) algorithm were used and evaluated according to both their processing time and detection rate. Standard value for defective inspection was the mean of the non-defect image feature. Similarity was decided via comparing standard value with sample image feature value. Totally, we achieved defective inspection accuracy above 95%.

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References

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