Abstract
$Cd_2GeSe_4$ and $Cd_2GeSe_4:Co^{2+}$ films were prepared on indium-tin-oxide(ITO)-coated glass substrates by using thermal evaporation. The crystallization was achieved by annealing the as-deposited films in flowing nitrogen. X-ray diffraction spectra showed that the $Cd_2GeSe_4$ and the $Cd_2GeSe_4:Co^{2+}$ films were preferentially grown along the (113) orientation. The crystal structure was rhomohedral(hexagonal) with lattice constants of $a=7.405\;{\AA}$ and $c=36.240\;{\AA}$ for $Cd_2GeSe_4$ and $a=7.43\;{\AA}$ and $c=36.81\;{\AA}$ for $Cd_2GeSe_4:Co^{2+}$ films. From the scanning electron microscope images, the $Cd_2GeSe_4$ and $Cd_2GeSe_4:Co^{2+}$ films were plated, and the grain size increased with increasing annealing temperature. The optical energy band gap, measured at room temperature, of the as-deposited $Cd_2GeSe_4$ films was 1.70 eV and increased to about 1.74 eV and of the as-deposited $Cd_2GeSe_4:Co^{2+}$ films was 1.79 eV and decreased to about 1.74 eV upon annealing in flowing nitrogen at temperatures from $200^{\circ}C$ to $500^{\circ}C$. The dynamical behavior of the charge carriers in the $Cd_2GeSe_4$ and $Cd_2GeSe_4:Co^{2+}$ films were investigated by using the photoinduced discharge characteristics technique.
진공증착법으로 $Cd_2GeSe_4$와 $Cd_2GeSe_4:Co^{2+}$ 박막을 ITO(indium tin oxide) 유리 기판 위에 제작하였다. 결정화는 증착된 박막들을 질소분위기의 전기로에서 열처리함으로서 이룰 수 있었다. X-선 회절 분석에 의하여 증착된 $Cd_2GeSe_4$와 $Cd_2GeSe_4:Co^{2+}$ 박막의 격자상수는 $a\;=\;7.405\;{\AA}$, $c\;=\;36.240\;{\AA}$와 $a\;=\;7.43\;{\AA}$, $c\;=\;36.81\;{\AA}$로서 능면체(rhombohedral) 구조이었고, 열처리 온도를 증가함에 따라 (113)방향으로 선택적으로 성장됨을 알 수 있었다. 열처리 온도를 증가시킴에 따라 입계 크기가 점차 커지고 판상구조로 결정화 되었다. 실온에서 측정한 광학적인 에너지 띠 간격은 열처리 온도의 증가에 따라 $Cd_2GeSe_4$ 박막의 경우 1.70 eV ~ 1.74 eV로 증가하였고, $Cd_2GeSe_4:Co^{2+}$ 박막의 경우 1.79 eV ~ 1.74 eV로 감소하였다. $Cd_2GeSe_4$와 $Cd_2GeSe_4:Co^{2+}$ 박막 내의 전하운반자들의 동역학적 거동을 광유기 방전 특성(PIDC : photoinduced discharge characteristics) 방법으로 조사하였다.
