과제정보
연구 과제 주관 기관 : 한국학술진흥재단
참고문헌
- T. C. Wen, S. J. Chang, L. W. Wu, Y. K. Su, W. C. Lai, C. H. Kuo, C. H. Chen, J. L. Sheu, and J. F. Chen, IEEE Trans. Electron. Devices. 49, 1093 (2002). https://doi.org/10.1109/TED.2002.1003762
- L. W. Wu, S. J. Chang, T. C. Wen, Y. K. Su, W. C. Lai, C. H. Kuo, C.H. Kuo, C. H. Chen, and J. K. Sheu, IEEE J. Quantum Electron. 38, 446 (2002). https://doi.org/10.1109/3.998615
- C. H. Kuo, S. J. Chang, Y.K. Su, J. F. Chen, L.W. Wu, J. K. Sheu, C. H. Chen, and G. C. Chi, IEEE Electron. Dev. Lett. 23, 240 (2002). https://doi.org/10.1109/55.998863
- C. H. Ko, Y. K. Su, S. J. Chang, T. M. Kuan, C. I. Chiang, W. H. Lan, W. H. Lin, and J. Webb, Jpn. J. Appl. Phys. 41, 2489 (2002). https://doi.org/10.1143/JJAP.41.2489
- J. S. Kwak and Y. Park, J. Korean Phys. Soc. 45, 988 (2004).
- S. Y. Kim, H. W. Jang, and J.-L. Lee, Appl. Phys. Lett. 82, 61 (2003). https://doi.org/10.1063/1.1534630
- J. O. Song, J. S. Kwak, Y. Park, and T. Y. Seng, Appl. Phys. Lett. 86, 213505 (2005). https://doi.org/10.1063/1.1937987
- J. O. Song, D. S. Leem, J. S. Kwak, Y. Park and T. Y. Seong, IEEE Photon. Technol. Lett. 17, 291 (2005). https://doi.org/10.1109/LPT.2004.839783
- H. H. Yu, S. J. Hwang, M. C. Tseng, C. C. Tseng, Opt. Commun. 259, 187 (2006). https://doi.org/10.1016/j.optcom.2005.08.053
- L. J. Meng and M. P. dos Santos, Thin Solid Films. 303, 151 (1997). https://doi.org/10.1016/S0040-6090(97)00050-3
- T. Minami, H. Sonohra, T. Kakumu, and S. Takata, Thin Solid Films. 270, 37 (1995). https://doi.org/10.1016/0040-6090(95)06889-9
- P. Lippens, A. Segers, J. Haemers, and R. De Gryse, Thin Solid Films. 317, 405 (1998). https://doi.org/10.1016/S0040-6090(97)00632-9
- H. W. Jang, C. M. Jeon, J. K. Kim, and J. L. Lee, Appl. Phys. Lett. 78, 2015 (2001). https://doi.org/10.1063/1.1360784
- J. I. Lee and S. K. Choi, J. Kor. Ceram. Soc. 37, 686 (2000).
- Y. Ohhata, F. Shinoki, and S. Yoshida, Thin Solid Films. 59, 255 (1979). https://doi.org/10.1016/0040-6090(79)90298-0
- B. E. Sernelius, K. F. Berggren, Z. C. Jin, I. Hamberg, and C. G. Granqvist, Phys. Rev. B37, 10244 (1988).
- K. Suzuki, N. Hashimoto, T.Oyama, J. Shimizu, Y. Akao, and H. Kojima, Thin Solid Films. 226, 104 (1993). https://doi.org/10.1016/0040-6090(93)90213-9
- J. George and C. S. Menon, Surf. Coat. Technol. 132, 45 (2000). https://doi.org/10.1016/S0257-8972(00)00726-X
- A. E. Hichou, A. Kachouane, J. L. Bubendorff, M. Addou, J. Ebothe, M. Troyon, and A. Bougrine, Thin Solid Films. 458, 263 (2004). https://doi.org/10.1016/j.tsf.2003.12.067
- A. Salehi, Thin Solid Films. 324, 214 (1998). https://doi.org/10.1016/S0040-6090(98)00371-X
- M. Nisha, S. Anusha, A. Antony, R. Manoj, and M. K. Jayaraj, Appl. Surf. Sci. 252, 1430 (2005). https://doi.org/10.1016/j.apsusc.2005.02.115
- L. J. Meng and M. P. dos Santos, Thin Solid Films. 322, 56 (1998). https://doi.org/10.1016/S0040-6090(97)00939-5
- Y. L. Choi, J. Kor. Inst. Met. & Mater. 45, 579 (2007).
- H. Ma, J. S. Cho, and C. H. Park, Surf. Coat. Technol. 153, 131 (2002). https://doi.org/10.1016/S0257-8972(01)01693-0