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The AC, DC Dielectric Breakdown Characteristics according to Dielectric Thickness and Inner Electrode Pattern of High Voltage Multilayer Ceramic Capacitor

고압 적층 칩 캐패시터의 유전체 두께 및 내부전극 형상에 따른 AC, DC 절연 파괴 특성

  • 윤중락 (삼화콘덴서공업(주) 부설연구소) ;
  • 김민기 (삼화콘덴서공업(주) 부설연구소) ;
  • 이석원 (호서대학교 시스템제어공학과)
  • Published : 2008.12.01

Abstract

High voltage multilayer ceramic capacitors (MLCCs) are classified into two classes-those for temperature compensation (class I) and high dielectric constant materials (class II). We manufactured high voltage MLCC with temperature coefficient characteristics of C0G and X7R and studied the characteristics of electric properties. Also we studied the characteristics of dielectric breakdown voltage (V) as the variation of thickness in the green sheet and how to pattern the internal electrodes. The dielectric breakdown by electric field was caused by defects in the dielectric materials and dielectric/electrode interface, so the dielectric thickness increased, the withstanding voltage per unit (E) thickness decreased. To overcome this problem, we selected the special design like as floating electrode and this design affected the increasing breakdown voltage(V) and realized the constant withstanding voltage per unit thickness(E). From these results, high voltage application of MLCCs can be expanded and the rated voltage can also be develop.

Keywords

References

  1. K. Kubota, S. Nishiyama, and K. Malhotra, "Ceramic Capacitors Aid High-Voltage Designs", Power Electronics Technology, p. 14, 2004
  2. J. R. Yoon, M. K. Kim, and T. S. Chung, "Fabrication and analysis of multilayer ceramic capacitors for medium and high voltage", J. of KIEEME(in Korean), Vol. 18, No. 8, p. 685, 2005 https://doi.org/10.4313/JKEM.2005.18.8.685
  3. J. R. Yoon, M. K. Kim, T. S. Chung, B. C. Woo, and S. W. Lee, "The electrical properties of high voltage multilayer chip capacitor with X7R by addition of $Er_{2}O_{3}$ and glass frit", J. of KIEEME(in Korean), Vol. 21, No. 5, p. 440, 2008 https://doi.org/10.4313/JKEM.2008.21.5.440
  4. Lundstorm, M., et al. "Measurement of the dielectirc strength of titanium dioxides ceramics", 12th IEEE Plused Power Conference, Vol. 2, p. 1489, 1999
  5. Galed H. Maher, James M. Wilson, and Samir G. Maher, "Effect of Dielectric Thickness on the dc and ac Dielectric Breakdown Field for Low Fired C0G and X7R Capacitors", CARTS Asia 2005, Taipei, p. 95, 2005
  6. Y. Zhou and N. Yoshimura, "Short-time DC breakdown phenomena in $BaTiO_{3}$-based multilayer ceramic capacitors," Jpn. J. Appl. Phys., Vol. 38, p. 1412, 1999 https://doi.org/10.1143/JJAP.38.1412