References
-
J. Hajto, P. J. S. Ewen, R. E. Belford, and A. E. Owen, "Interference grating fabrication in spincoated
$As_2S_3$ films", Thin Solid Films, Vol. 200, p. 229, 1991 https://doi.org/10.1016/0040-6090(91)90195-4 - M. N. Kozicki, S. W. Hsia, A. E. Owen, and P. J. S. Ewen, "Pass - a chalcogenide-based lithography scheme for I.C. fabrication", J. Non-Cryst. Solids Vol. 137-138, p. 1341, 1991 https://doi.org/10.1016/S0022-3093(05)80372-2
- T. Kawaguchi, S. Maruno, and S. R. Elliott, "Photoinduced surface deposition of metallic silver in Ag---As---S glasses: effect of addition of other elements", J. Non-Cryst. Solids, Vol. 212, p. 166, 1997 https://doi.org/10.1016/S0022-3093(97)00030-6
- M. N. Kozicki, C. Gopalan, M. Balakrishnan, M. Park, and M. Mitkova, "Non-volatile memory based on solid electrolytes", Proceedings of the 2004 Non- Volatile Memory Technology Symposium, p. 10, 2004
- R. Symanczyk, M. Balakrishnan, C. Gopalan, T. Happ, M. Kozicki, M. Kund, T. Mikolajick, M. Mitkove, M. Park, C.-U. Pinnow, J. Robertson, and K.-D. Ufert, "Electrical characterization of solid state ionic memory elements", Proceedings of the 2003 Non-Volatile Memory Technology Symposium, p. 17-1, 2003
- M. N. Kozicki, M. Park, and M. Mitkova, "Nanoscale memory elements based on solid state electrolytes", IEEE Trans. Nanotechnology, Vol. 4, No. 3, p. 331, 2005 https://doi.org/10.1109/TNANO.2005.846936
- H. Choi, S. M. Koo, W. J. Cho, Y. H. Lee, and H. B. Chung, "Properties on electrical resistance change of Ag-doped chalcogenide thin films application for programmable metallization cell", J. of KIEEME(in Korean), Vol. 20, No. 12, p. 1022, 2007 https://doi.org/10.4313/JKEM.2007.20.12.1022