A Development of Electron Optics System of Mini-Sized SEM

소형주사전자현미경용 전자공학계의 개발

  • 박만진 (서울대학교 기계항공공학부) ;
  • 김일해 (CAMSYS(주)) ;
  • 김동환 (서울산업대학교 기계설계자동화 공학부) ;
  • 장동영 (서울산업대학교 산업정보시스템 공학과) ;
  • 한동철 (서울대학교 기계항공공학부)
  • Published : 2007.10.15

Abstract

As an electron scanning microscopes has traditionally required a considerably large room equipped with several service and pipe lines due to its inherent size. As an alternative, a small sized SEM, simply called a mini-SEM, is introduced even if the performance in terms of magnification and resolution is a little inferior to a classical thermal SEM. However, the size and fabrication cost is dramatically reduced, dedicating to opening a new market. The optical system in the mini-SEM is redesigned and specimen stage is quitely reduced and vertical axis is excluded. The design tools and calibration techniques to develope the mini-SEM are introduced and its performance is verified through numerical analysis experiments.

Keywords

References

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