참고문헌
- S. P. Murarka, 'Self-aligned silicides or metals for very large scale integrated circuit applications', J. Vac. Sci. Technol. B, Vol. 4, p. 1325, 1986
- H. Iwai, T. Ohguro, and S. I. Ohmi, 'NiSi salicide technology for scaled CMOS', Microelectron. Eng., Vol. 60, p. 157,2000
- F. Deng, R.A. Johnson, P. M. Asbeck, and S. S. Lay, 'Salicidation process using NiSi and its device application', J. Appl. Phys., Vol. 81, No. 12, p. 8047, 1997
- C. J. Choi, Y. W. Ok, S. S. Hullavarad, T. Y. Seong, K. M. Lee, J. H. Lee, and Y. J. Park, 'Effects of hydrogen implantation on the structural and electrical properties of nickel silicide', J. Electrochem. Soc., Vol. 149, p. G517,2002
- Y. J. Kim, S. Y. Oh, W. J. Lee, Y. Y. Zhang, Z. Zhong, S. Y. Jung, H. H. Ji, H. S. Cha, Y. C. Kim, J. S. Wang, and H. D. Lee, 'Thermal stability improvement of Nickel Germanosilicide utilizing Ni-Pd alloy nano-scale CMOS technology', IEEE Si Nanoelectronics Workshop, p. 51,2006
- L. J. Jin, K. L, Pey, W. K. Choi, D. A. Antoniadis, E. A. Fitzgerald, and D. Z. Chi, 'Electrical characterization of 'platinum and palladium effects in nickel monosilicide/n-Si Schottky contacts', Thin Solid Films, Vol. 504, p. 149,2006 https://doi.org/10.1016/j.tsf.2005.09.063
- K. L. Pey, P. S. Lee, and D. Mangelinck, 'Ni(Pt) alloy silicidation on (100) Si and poly-silicon lines', Thin Solid Films, Vol. 462-463, p. 137,2004
- P. S. Lee, K. L. Pey, D. Mangelinck, J. Ding, D. Z. Chi, and L. Chan, 'New salicidation technology with Ni(Pt) alloy for MOSFETs', IEEE Electron Device Lett., Vol. 22, No. 12, p. 568,2001
- S. Y. Oh, J. G. Yun, B. F. Huang, Y. J. Kim, H. H. Ji, U. S. Kim, H. S. Cha, S. B. Heo, J. G. Lee, J. s. Wang, and H. D. Lee, 'Novel nitrogen doped Ni self-alingned silicide process for nanoscale complementary metal oxide semiconductor technology', Jpn. J. Appl. Phys., Vol. 44, p. 2142, 2005 https://doi.org/10.1143/JJAP.44.2142
- M. C. Sun, M. J. Kim, J. H. Ku, K. J. Roh, C. S. Kim, S. P. Youn, W. Jung, S. Choi, N. I. Lee, H. K. Kang, and K. P. Suh, 'Thermally robust Ta-doped Ni SALICIDE process promising for sub-Sfl urn CMOSFETs', Symposium on VLSI Tech. Dig., p. 81,2003
- Y. J. Kim, C. J. Choi, R. J. Jung, S. Y. Oh, J. G. Yun, W. J. Lee, H. H. Ji, J. S. Wang, and H. D. Lee, 'The effect of triple capping layer (Ti/Ni/TiN) on the electrical and structural properties of nickel monosilicide', J. Electrochem. Soc., Vol. 153, p. G35,2006 https://doi.org/10.1149/1.2130695
- B. F. Huang, S. Y. Oh, J. G. Yun, Y. J. Kim, H. H. Ji, Y. G. Kim, J. S. Wang, and H. D. Lee, 'Study of Ni-germano silicide thermal stability for nano-scale CMOS technology', J. of KIEEME(in Korean), Vol. 17, No. 11, p. 1149,2004
- J. L. Hoyt, H. M. Nayfeh, S. Eguchi, I. Aberg, G. Xia, T. Drake, E. A. Fitzgerald, and D. A. Antoniadis, 'Strained silicon MOSFET technology', in IEDM Tech. Dig., p. 23, 2002
- S. L. Cheng, H. M. Lo, L. W. Cheng, S. M. Chang, and L. J. Chen, 'Effects of stress on the interfacial reactions of metal thin films on (001)Si', Thin Solid Films, Vol. 424, p. 33, 2003 https://doi.org/10.1016/S0040-6090(02)00902-1
- C. J. Tsai and K. H. Yu, 'Stress evolution during isochronal annealing of Ni/Si system', Thin Solid Films, Vol. 350, p. 91, 1999
- S. S. Guoa, Y. C. Chub, and C. J. Tsai, 'Stress evolution in Co/Ti/Si system', Mater. Chern. Phy., Vol. 88, p. 71,2004 https://doi.org/10.1016/j.matchemphys.2004.06.011
- C. J. Tsai, P. L. Chung, and K. H. Yu, 'Stress evolution of Ni/Pd/Si reaction system under isochronal annealing', Thin Solid Films, Vol. 365, p. 72, 2000
- G. G. Stoney, 'The tension of metallic films deposited by electrolysis', Proc. R. Soc. London, Ser. 4, Vol. 82, p. 172, 1909
- W. A. Brantley, 'Calculated elastic constants for stress problems associated with semiconductor devices', J. Appl. Phys., Vol. 44, p. 534, 1973