Numerical Analysis for the Image Evaluation of a Thermionic SEM

열전자형 주사전자현미경 결상특성의 수치해석

  • 정현우 (서울산업대학교 나노생산기술연구소) ;
  • 박만진 (서울산업대학교 나노생산기술연구소) ;
  • 김동환 (서울산업대학교 기계설계.자동화공학부) ;
  • 장동영 (서울산업대학교 산업정보시스템공학과) ;
  • 박근 (서울산업대학교 기계설계.자동화공학부)
  • Published : 2007.12.15

Abstract

The present study covers numerical analysis of a thermionic scanning electron microscope(SEM) column. The SEM column contains an electron optical system in which electrons are emitted and moved to form a focused beam, and this generates secondary electrons from the specimen surfaces, eventually making an image. The electron optical system mainly consists of a thermionic electron gun as the beam source, the lens system, the electron control unit, and the vacuum unit. For a systematic design of the electron optical system, the beam trajectories are investigated through numerical analyses by tracing the ray path of the electron beams, and the quality of resulting image is evaluated from the analysis results.

Keywords

References

  1. Lee, R. E., 1993, Scanning Electron Microscopy and X-Ray Microanalysis, Prentice Hall
  2. Reimer, L., 1998, Scanning Electron Microscopy – Physics of Image Formation and Microanalysis, Springer-Berlin
  3. Juma, S. M. and Mulvey, T., 1978, 'Miniature rotation-free magnetic electron lenses for the electron microscope,' J. Phys. E: Sci. Instrum., Vol. 11, pp. 759-764 https://doi.org/10.1088/0022-3735/11/8/014
  4. Zhu, X. and Munro, E., 1989, 'A computer program for electron gun design using second-order finite elements,' J. Vac. Sci. Technol. B, Vol. 7, pp. 1862-1869 https://doi.org/10.1116/1.584681
  5. Park, K., Park, M. J., Kim, D. H., and Jang, D. Y., 2006, 'Numerical analysis for electron optical system of a field emission SEM,' Trans. Kor. Soc. Mech. Engr. (A), Vol. 30, pp. 1577-1583 https://doi.org/10.3795/KSME-A.2006.30.12.1557
  6. Park, K., Jung, H. W., Park, M. J., Kim, D. H., and Jang, D. Y., 2007, 'A study on design and analysis for magnetic lenses of a scanning electron microscope using finite element method,' J. Kor. Soc. Prec. Engr., Vol. 24, pp. 95-102
  7. Orloff, Jon., 2004, Handbook of Charged Particle Optics, CRC Press, New York
  8. Munro, E., 2005, OPTICS - Software for Electron and Ion Beam Column Design, MEBS Ltd., London
  9. Lim, S. J. and Lyou, J., 2006, 'Development of intelligent remote beam control function in E-beam manufacturing system,' Trans. Kor. Soc. Mach. Tool Engr., Vol. 15, pp. 24-29