참고문헌
- M. Katayama, Thin Solid Films, 341 (1999) 140 https://doi.org/10.1016/S0040-6090(98)01519-3
- Korea Price Data System(PDS), www.koreapds.com
- Kurt J. Lesker Company, www.lesker.com
- T. Minami, Semicon. Sci. Technol., 20 (2005) S35 https://doi.org/10.1088/0268-1242/20/4/004
- M. Chen, X. Wang, Appl. Surf. Sci., 158 (2000) 134 https://doi.org/10.1016/S0169-4332(99)00601-7
- Seung-Jae Jung, Young-Hun Han, Jung-joong Lee, J. Kor. lnst. Surf. Eng., 39 (2006) 98
- J. H. Joo, J. Vac. Sci. Technol., A18(1) (2003) 23
- J. H. Joo, J. Kor. Vac. Soc., 7 (1998) 255
- S. J. Jung, Y. H. Han, B. M. Koo, J. J. Lee, J. H. Joo, Thin Solid Film, 475 (2005) 275-278 https://doi.org/10.1016/j.tsf.2004.08.058
- H. D. Na, H. S. Park, D. H. Jung, G R. Lee, J. H. Joo, J. J. Lee, Surf. Coat. Technol., 169-170 (2003) 41
- H. Kerstein, H. Deutsch, H. Steffen, G. M. W. Kroesen, R. Hippler, Vacuum, 63 (2001) 385 https://doi.org/10.1016/S0042-207X(01)00350-5
- C. Niikura, M. Kondo, A. Matsuda, J. Non-Cryst. Solids, 338-340 (2004) 42 https://doi.org/10.1016/j.jnoncrysol.2004.02.018
- B. Rech, T. Repmann, M. N. van den Donker, M. Berginski, T. Kilper, J. Huepkes, S. Calnan, H. Stiebig, S. Wieder, Thin Solid Films, 511-512 (2006) 548-555
- N. Bowden, W. T. S. Huck, K. E. Paul, G M. Whitesides, Appl. Phys. Lett., 75 (1999) 2557 https://doi.org/10.1063/1.125076
- Lucel Sirghi, Gheorghe Popa, Yoshinori Hatanaka, Thin Solid Films, 515 (2006) 1334-1339 https://doi.org/10.1016/j.tsf.2006.03.059
- M. C. Coen, R. Lehmann, P. Groening, L. Schlapbach, Appl. Surf. Sci., 207 (2003) 276 https://doi.org/10.1016/S0169-4332(02)01503-9
- J. P. Biersack, in: P. Mazzoldi, G. W. Arnold (Eds.), Ion Beam Modification of Insulators, Elsevier, Amsterdam, 1987
- E. Liston, J. Adhes., 30 (1989) 199 https://doi.org/10.1080/00218468908048206
- Sherman, A., Thin Solid Films, 113 (1984) 135 https://doi.org/10.1016/0040-6090(84)90022-1
- National Institute of Standard and Technology(NIST), http://physics.nist.gov /PhysRefData/Handbook/index.html