KSTLE International Journal

Korean Tribology Society (한국트라이볼로지학회)
권호 표지

A Comparison of Friction Force Calibration in Lateral Force Microscope

  • Wang Yuli-Ang (Tribology Research Center, Korea Institute of Science and Technology, Department of Mechatronic Engineering, Mechanic and Engineering School, Harbin Institute of Technology) ;
  • Kim Hong-Joon (Tribology Research Center, Korea Institute of Science and Technology) ;
  • Kong Ho-Sung (Tribology Research Center, Korea Institute of Science and Technology) ;
  • Zhao Xu-Zheng (Department of Mechatronic Engineering, Mechanic and Engineering School, Harbin Institute of Technology) ;
  • Yoon Eui-Sung (Tribology Research Center, Korea Institute of Science and Technology)
  • Published : 2006.06.01
Download PDF
⟨ Previous Next ⟩

Abstract

The main principle of two widely used methods which were proposed by Ruan and Bhushan, and by Ogletree and Carpick are introduced. Experiments were conducted using the two methods to measure friction force between AFM probe and silicon sample quantitatively. To characterize the frictional properties, the conversion factors of the two methods by which lateral electronic signal is converted into actual friction force were calculated. The experimental results show that that the conversion factors were extraordinarily different from each other. Further research should be done to identity the reasons for these differences.

Keywords

References

  1. Neumeister, J.M, Ducker, W. A., 'Lateral, normal, and Longitudinal spring constants of atomic force microscopy cantilevers', American Institute of Physics 65(8), pp. 2527-2531, 1994
  2. Breakspear, S, Smith, J.R, Nevell, T.G, Tsibouklis, J., 'Friction Coefficient Mapping Using the Atomic Force Microscope', Surface and Interface Analysis 36, pp. 1330-1334,2004 https://doi.org/10.1002/sia.1914
  3. Meyer, G, Amer, N.M., 'Simultaneous Measurement of Lateral and Normal Forces with An Optical-Beam- Deflection Atomic Force Microscope', Applied Physics Letter 57(20), 1990
  4. Ruan, J, Bhushan, B., 'Atomic-Scale Friction Measurements Using Friction Force Microscopy: Part I-General Principles and New Measurement Techniques', Journal of Tribology 116(2), pp. 378-, 1994 https://doi.org/10.1115/1.2927240
  5. Ogletree, D.F, Carpick, R.W, Salmeron, M., 'Calibration of Friction Forces in Atomic Force Microscopy', Review of Scientific Instrument 67(9), pp. 3298-3386, 1996 https://doi.org/10.1063/1.1147411
  6. Varenberg, M, Etsion, I, Halperin, G.., 'An Improved Wedge Calibration Method for Lateral Force in Atomic Force Microscopy', Review of Scientific Instruments 74(7), pp. 3362-3367, 2003 https://doi.org/10.1063/1.1584082
  7. Liu, E, Blanpain, B, Celis, J.P., 'Calibration Procedures for Frictional Measurements with A Lateral Force Microscope', Wear 192, pp. 141-150, 1996 https://doi.org/10.1016/0043-1648(95)06784-1
  8. Carpick, R.W, Ogletree, D.F, Salmeron, M., 'A New Nanomechanical Measurement for the Determination of Shear Strengths with Friction Force Microscopy', Applied Physics Letter 70(12), pp. 1548-1550, 1997 https://doi.org/10.1063/1.118639
  9. Cain, R.G, Biggs, S, Page, N.W.,. 'Force Calibration in Lateral Force Microscopy', Journal of Colloid and Interface Science 227, pp. 55-65, 2000 https://doi.org/10.1006/jcis.2000.6840
  10. Liu, Y, Wu, T, Ewans, D.F., 'Lateral Force Microscopy on the Shear Properties of Self-Assembled Monolayers of Dialkylammonium Surfactant on Mica', Langmuir 10, pp. 2241-2245, 1994 https://doi.org/10.1021/la00019a035
  11. Bogdanovic, G, Meurk, A., Rutland, M.W., 'Tip FrictionTorsional Spring Constant Determination', Elsevier Science B.V. 19, pp. 398-405, 2000
  12. Bhushan, Bharat, Handbook of Micro/Nano Tribology. 2. CRC Press, 1999