Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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An Inproved Algorithm of Eigenvalue Equation for Silica Double Layer Slab Waveguides

실리카 2층 Slab 도파로를 위한 고유방정식의 개선된 알고리즘

  • Ji yoo-kang (Dept. of Information & Communication Eng. Dongshin University) ;
  • Park jong-ran (Dept. of Electrical & Electronic Dongkang College) ;
  • Yun jung-hyun (Dept. of Electronics Eng. Chosun University) ;
  • Park soo-bong (Dept. of Information & Communication Eng. Dongshin University)
  • 지유강 (동신대학교 정보통신공학과) ;
  • 박종란 (동강대학 전기전자과) ;
  • 윤중현 (조선대학교 전자공학과) ;
  • 박수봉 (동신대학교 정보통신공학과)
  • Published : 2006.02.01
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Abstract

In this paper, we derive a novel eigenvalue equation of double silica layers on silicon only for TE mode and present the method as an example how to use it to determine the refractive indices and thicknesses with prism coupler. Our method to solve eigenvalue equation have good merit rather than [5] in that the equation is real and iteration parameters can be reduced from four to three. The average magnitude of the errors is less than $10^{-5}\~10^{-6}$ approximately

본 논문에서는 실리콘 상의 2층 실리카 도파로에서 새로운 고유치 방정식을 도출하여, 프리즘 커플러로 굴절률과 박막의 두께를 결정하는 방법을 나타내었다. 도출된 고유치 방정식의 알고리즘은 반복 파라메터가 4개의 변수에서 3개의 변수로 감소되어질 수 있으므로 Ref.[5]의 방정식의 해보다 보다 좋은 장점을 갖으며. 또한 본 논문에 얻어진 평균 에러는 약 $10^{-5}\~10^{-6}$ 이 하였다.

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References

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