References
- A. F. Belyanin, L. L. Bouilov, V. V. Zhirnov, A. I. Kamenev, K. A. Kovalskij and B. V. Spitsyn, Dia. and Rel Mater., 8, 369 (1999) https://doi.org/10.1016/S0925-9635(98)00412-9
- K. Kaya, H. Takahashi, Y. Shibata, Y. Kanno and T. Hirai, Jpn. J. Appl. Phys., 36, 2837 (1997) https://doi.org/10.1143/JJAP.36.2837
- J. A. Ruffner, P. G. Clem, B. A. Tuttle, D. Dimos and D. M. Gonzles, Thin Solid Fllms, 354, 256 (2000) https://doi.org/10.1016/S0040-6090(99)00521-0
- Z. R. Song, Y. H. Yu. S. C. Zou. Z. H. Zheng, D. S, Shen, E. Z. Luo, Z, Xie, and B. Sundaravel, Thin Solid Films, 459. 41 (2004) https://doi.org/10.1016/j.tsf.2003.12.091
- L. M. Sheppard, Ceram. Bull, 69, 1801 (1990)
- Y. Baik anld R. A. L. Drew, Key Eng. Mater., 122, 553 (1996) https://doi.org/10.4028/www.scientific.net/KEM.122-124.553
- Y. Kameshima, M. Irie, A. Yasumori and K. Okada, Sol. Stat, Ionics, 172, 185 (2004) https://doi.org/10.1016/j.ssi.2004.05.015
- J. C. Kuang, C. R. Zhang, X. G. Zhou, and S. Q. Wang, J. Cryst. Growth, 263, 12 (2004) https://doi.org/10.1016/j.jcrysgro.2003.10.089
- T. Sakai and M. Jwata. Jpn, J. Ceram. Soc., 82, 181 (1974)
- S. Hirai, T. Miwa, T. twata, M. Ozawa and H. G. Katayama, J. Jpn Inst. Metals, 53, 1035 (1989) https://doi.org/10.2320/jinstmet1952.53.10_1035
- V. Rosenband and A. Gany, J. Mater. Process. Technol., 147, 197 (2004) https://doi.org/10.1016/j.jmatprotec.2003.12.017
- C. N. Lin and S, L. Chung, J. Mater, Res., 16, 2200 (2001) https://doi.org/10.1557/JMR.2001.0302
- H. P. Klug and L. E. Alexander, X-ray Diffraction Procedures, New York, p.531 (1974)
- A. Chang, S, W. Rhee and S. Baik, J. Am. Ceram. Soc., 78, 33 (1995) https://doi.org/10.1111/j.1151-2916.1995.tb08357.x
- Z. Y. Fan and N. Newman, Mater. Sci and Eng., B 87, 244 (2001) https://doi.org/10.1016/S0921-5107(01)00720-6
- O. Ambacher, M. S, Brandt, R. Dimitrov, T. Metzger, M. Stutzmann, R. A. Fischer, A. Miehr, A. Bergmaier and G. Dollinger, J. Vac. Sci. Technol., B 14, 3532 (1996) https://doi.org/10.1116/1.588793
- A. T. Collins, E .C. Lightowlers and P. J. Dean, Phys. Rev., 158, 833 (1967) https://doi.org/10.1103/PhysRev.158.833
- W. Zhang, Y. Someno, M. Sasaki and T. Hirai, Jpn. J. Appl, Phys., 32, L116 (1993) https://doi.org/10.1143/JJAP.32.L116
- F. Hasegawa, T. Takahashi, K. Kubo and Y. Nannichi, Jpn. J. Appl. Phys., 26, 1555 (1987) https://doi.org/10.1143/JJAP.26.1555
- S. M. Oh and D. W. Park, Thin Solid Films. 316, 189 (1998) https://doi.org/10.1016/S0040-6090(98)00413-1
- G Beamson and D. Briggs, Infrared Spectra of Inorganic Compouods, vol. 4, p.110, Academic Press Inc., London, 1997
- J. M. Hays, M. Kuball, Y. Shi, and J. H. Edgar, Jpn. J. Appl. Phys., 39, L710 (2000) https://doi.org/10.1143/JJAP.39.L710
- V. Y. Davydov, Y. E. Kitaev, I. N. Goncharuk, A. N. Smirnov, J. Graul, O. Semchinova, D. Uffmann, M. B. Smirnov, A. P. Mirogorodsky and R. A. Evarestov, Phys, Rev, B 58, 12899 (1998) https://doi.org/10.1103/PhysRevB.58.12899
- L. Filippids. H. Siegle, A. Hoffmann, C. Thomsen, K. Karch and F. Bechstedt. Phys. Stat, Sol., B 198, 621 (1996) https://doi.org/10.1002/pssb.2221980207
- U. Haboeck H. Siegle A. Hoffmann and C. Thomsen, Phys. Stat. Sol., C 6, 1710 (2003)
- C. Carlone, K, M. Lakin, and. H. R. Shanks, J. Appl, Phys., 55, 4010 (1984) https://doi.org/10.1063/1.332989