References
- K. van Dijk, H. G. Schaeken, J. G. G. Wolke and J. A, Jansen, Biomaterials, 17, 405-410 (1998) https://doi.org/10.1016/0142-9612(96)89656-6
- K. van Dijk, H. G. Schaeken, C. H. M. Maree, J. Verhoeven, J. G. G. Wolke, F. H. P. M. Habraken and J. A. Jansen, Surface and Coatings Technology, 76-77, 206-210 (1995) https://doi.org/10.1016/0257-8972(95)02590-1
- J. L. Ong, D. R. Villarreal, R. and Ma K. Kavin, Journal of Materials Science: Materials Medicine, 12, 491 (2001) https://doi.org/10.1023/A:1011259311032
- W. J. Lo, D. M. Grant, M. D, Ball, B. S. Welsh, S. M. Howdle, E. N. Antonov, V. N. Bagratashvili and V. K. Popov, John Wiley & Sons, Inc, J. Biomed. Mater, Res., 50, 536 (2000) https://doi.org/10.1002/(SICI)1097-4636(20000615)50:4<536::AID-JBM9>3.0.CO;2-U
- M. Okazaki, Y. Yoshida, S, Yamaguchi, M. Kaneno and J. C. Elliott, Biomaterials, 22, 2459-2464 (2001) https://doi.org/10.1016/S0142-9612(00)00433-6
- M. Okazaki, Y. Miake, H. Tohda, T. Yanagisawa, T. Matsumoto and J. Takahashi, Biomaterials, 20, 1421-1426 (1999) https://doi.org/10.1016/S0142-9612(99)00049-6
- M. Okazaki and J. Takahashi, Biomaterials, 20, 1073-1078 (1999) https://doi.org/10.1016/S0142-9612(98)00244-0
- Qing Liua, Jiang Dingb, F. K. Mantee, S. L. Wunderb and G. R. Barana, Biomaterials, 23, 3103-3111 (2002) https://doi.org/10.1016/S0142-9612(02)00050-9
- C. H. Jung and M. H. Kim, Kor. J. Mater, Res., 13(4), 205-212 (2003) https://doi.org/10.3740/MRSK.2003.13.4.205
- Metals Handbook : Properties and Selection-Nonferrous Alloys and Special-Purpose Materials, Vol. 2, Tenth Edition, p.620, ASM International, USA, (1990)
- D. R. Gaskell, Introduction to the Thermodynamics of Materials, 3th ed., p.538-539. SciTech Media, Seoul, Korea, (1999)
- J. F. Moulder, W. F. Stickle, P. E. Stickle and K. D. Bomben, Handbook of X-ray Photoelectron Spectroscopy, Physical Electronics, Inc., Perkin-Elmer Corporation, Eden Prairie, Minnesota, USA, (1995)
- A. Casagrande, A. Glisenti, E. Lanzoni, E. Tondello, L. Mirenghi, M, Casarin and R. Bertoncello, Surface and Interface Analysis, 18, 525-531 (1992) https://doi.org/10.1002/sia.740180712
- H. I. P. Johansson, K. L. Hakansson and L. I. Johansson, Physical Review B, 48(19), 14520-14523 (1993) https://doi.org/10.1103/PhysRevB.48.14520
- C. Landron, D. Billard, D. Massiot, G. Peraudeau, J. P. Coutures and R. Erre, Radiation Effects, 98, 83-91 (1986) https://doi.org/10.1080/00337578608206100
- A. Tressaud, E. Papirer, F. Moguet, G. Nanse and P. Fioux, Carbon, 35(2), 175-194 (1997) https://doi.org/10.1016/S0008-6223(96)00095-4
- H. F. Franzen, J. Merrick, M. Umana, A. S. Khan, D. T. Peterson, J. R, Mc-Creary and R. J. Thorn, J. Electron Spectrosc, Relat. Phenom., 11, 439 (1977) https://doi.org/10.1016/0368-2048(77)80019-4
- T. L. Barr, J. Vac. Sci. Technol. A, 9(3), 1793-1805 (1991) https://doi.org/10.1116/1.577464
- B. F. Lowenberg, B. W. Callen, J. E. Davies, R. N. S. Sodhi and S. Lugowski, Journal of Biomedical Materials Research, 29, 279-290 (1995) https://doi.org/10.1002/jbm.820290302
- C. D. Wagner and J. A. Taylor, J. Electron Spectrosc. Relat. Phenom., 20, 83 (1980) https://doi.org/10.1016/0368-2048(80)85008-0
- H. Iwasaki, Y. Mizokawa, R. Nishitani and S. Nakamura, Surf, Sci., 86, 811 (1979) https://doi.org/10.1016/0039-6028(79)90462-X
- R. Nishitani, H. Iwasaki, Y. Mizokawa and S, Nakamura, Jpn. J. Appl. Phys., 17, 321 (1978) https://doi.org/10.1143/JJAP.17.321
- P. Swift, Surf. Interface Anal., 4, 47 (1982) https://doi.org/10.1002/sia.740040204
- C. D. Wagner, W. M. Riggs, L. E. Davis, J. F. Moulder and G. E. Mullenberg, Handbook of X-ray Photoelectron Spectroscopy, Physical Electronics Division, Perkin-Elmer Corporation, Eden Prairie, MN (1979)
- C. R. Anderson, R. N, Lee, J. F. Morar and R. L. Park, J. Vac. Sci. Technol., 20, 617 (1982) https://doi.org/10.1116/1.571406
- D. Briggs and M. P. Seah, John WILLEY & SONS, Vol. 1, second edition (1993)
- E. C. Onyiriuka, Applied Spectroscopy, 47(1) (1993) https://doi.org/10.1366/0003702934048488
- C. H. Cardinaud, G. Lemperiere, M. C. Peignon and P. Y. Jouan, Applied Surface Science, 68, 595-603 (1993) https://doi.org/10.1016/0169-4332(93)90241-3
- D. Simon, C. Perrin and J. Bardolle, Microsc. Electron, 1, 175 (1976)
- C. D. Wagner, W. M. Riggs, L. E. Davis, J. F. Moulder and G. E. Mullenberg, Handbook of X-ray Photoelectron Spectroscopy, Physical Electronics Division, Perkin-Elmer Corporation, Eden Prairie, MN (1992)
- S. Sato, S. Shin, S. Suzuki, T. Ejirna, T. Ishii and Y. Tezuka, Journal of the Physical Society of Japan, 63(1), 347-357 (1994) https://doi.org/10.1143/JPSJ.63.347
- A. Fernandez, A. R. Gonzalez-Elipe, D. Leinen, J. P. Espinos and J. P. Holgado, Applied Surface Science, 68, 453-459 (1993) https://doi.org/10.1016/0169-4332(93)90226-2
- Tetsuya Tateishi, Yoshimasa Ito and Yoshirnitsu Okazaki, Materials Transactions, JIM, 38(1), 78-84 (1997) https://doi.org/10.2320/matertrans1989.38.78
- A. E. Miller, C. Ernsberger, D. Banks, J. Nickerson and T. Smith, J. Vac. Sci. Technol. A, 4(6), 2784-2788 (1986) https://doi.org/10.1116/1.573679
- A Weninger, J. E. Davies, K. Sreenivas and R. N, S Sodhi, J. Vac. Sci, Technol. A, 9(3), 1329-1333 (1991) https://doi.org/10.1116/1.577621
- J. A. Tayler, J. vac. Sci. Technol., 20, 751 (1982) https://doi.org/10.1116/1.571450
- C. D. Wagner, D. E. Passoja, H. F. Hillery, T. G. Kinisky, H. A, Six, W. T. Jansen and J. A. Taylor, J. Vac. Sci. Technol., 21, 933 (1982) https://doi.org/10.1116/1.571870
- E. Ollivier and F. Cordier, Surface and Interface Analysis, 23, 601-608 (1995) https://doi.org/10.1002/sia.740230905
- K. T. Ng and D. M. Hercules, J. Phys. Chem., 80, 2095 (1976) https://doi.org/10.1021/j100560a009
- V. L. Nefedov, J. Electron Spectrosc, Relat. Phenom., 25, 29 (1982) https://doi.org/10.1016/0368-2048(82)85002-0
- G. E. McGuire, G. F. F. Schweitzer and T. A. Carlson, Inorg. Chem., 12, 2451 (1973) https://doi.org/10.1021/ic50128a045
- V. I. Nefodov, Y. V. Salyn, G. Leonhardt and R. Scheibe, J. Electron Spectrosc. Relat. Phenom., 10, 121 (1977) https://doi.org/10.1016/0368-2048(77)85010-X
- T. L. Barr, Appl. Surf. Sci., 15, 1 (1983) https://doi.org/10.1016/0378-5963(83)90003-X
- J. C. Klein and D. M. Hercules, J. Catal., 82, 424 (1983) https://doi.org/10.1016/0021-9517(83)90209-9
- V. I. Nefedov, D. Gati, B. F. Dzhurinskii, N. P. Sergushin, Y. V. Salyn and Zh, Neorg. Khim., 20, 2307 (1975)
- R. J. Colton, A. M. Guzman and J. W. Rabalais, J. Appl. Phys, 49, 409 (1978) https://doi.org/10.1063/1.324349
- D. Briggs and M. P. Seah, John WILLEY & SONS, Vol. 1, second edition (1993)
- D. Borgmann, E. Hums, G. Hopfengartner, G. Wedler, G. W. Spitznagel and I. Rademacher, Journal of Electron Spectroscopy and Related Phenomena, 63, 91-116 (1993) https://doi.org/10.1016/0368-2048(93)80042-K
- W. E. Morgan, J. R. Van Wazer and W. J. Stec, J. Am. Chem. Soc., 95, 751 (1973) https://doi.org/10.1021/ja00784a018
- R. Gresch, W. Mueller-Warmuth and H. Dutz, J. Non-Cryst. Solids, 34, 127 (1979) https://doi.org/10.1016/0022-3093(79)90012-7
- D. Costa. P. Marcus and W. P. YANG, Journal Electrochem. Soc., 141(10), 2669-2676 (1994) https://doi.org/10.1149/1.2059166
- B. F. Dzhurinskii, D. Gati, N. P. Sergushin, V. I. Nefedov and YA. V. Salyn, Russian Journal of Inorganic Chemistry, 20, 2307-2314 (1975)