DOI QR코드

DOI QR Code

Measurement of High Temperature Dielectric Property at Microwave Frequency Using Cavity Perturbation Method

Cavity Perturbation Method를 이용한 마이크로파 주파수대의 고온 유전특성 측정 연구

  • Kim, Dong-Eun (Advanced Key Material Lab, Korea Institute of Ceramic Engineering and Technology) ;
  • Jung, Jin-Ho (Advanced Key Material Lab, Korea Institute of Ceramic Engineering and Technology) ;
  • Lee, Sung-Min (Advanced Key Material Lab, Korea Institute of Ceramic Engineering and Technology) ;
  • Kim, Hyung-Tae (Advanced Key Material Lab, Korea Institute of Ceramic Engineering and Technology)
  • Published : 2006.12.28

Abstract

High temperature dielectric constants of the various ceramic materials have been measured using cavity perturbation method. The measurements were applied to refractory, traditional and fine ceramic powder compacts from room temperature to $1200^{\circ}C$. Calibration constant in the equation suggested by Hutcheon et al., was determined from the dielectric constants of reference specimen (teflon and alumina) at room temperature. From these results, informations on the refectory materials were obtained for the microwave kiln design and understanding of the microwave heating effects of ceramics have been improved.

Keywords

References

  1. T. Usami and T. Ochiai, FC Report 21 (2003) 257 (Japanese)
  2. E. Breval, J. P. Cheng, D. K. Agrawal, P. Gigal, M. Dennis, R. Roy and A. J. Papworth: Mat. Sci. Eng. A, 391 (2005) 285 https://doi.org/10.1016/j.msea.2004.08.085
  3. J. W. Kim, S. C. Choi, J. C. Lee and J. H. Oh: J. Kor. Ceram. Soc., 39 (2002) 669 (Korean)
  4. E. J. Minay, A. R. Boccaccini, P. Veronesi, V. Cannillo and C. Leonelli: J. Mater. Process. Tech., 155-156 (2004) 1749
  5. B. W. Hakki and P. D. Coleman: IRE Trans., MTT-8 (1960) 402
  6. H. Ebara, T. Inoue and O. Hashimoto: Sci. Tech. Adv. Mater., 7 (2006) 77 https://doi.org/10.1016/j.stam.2005.11.019
  7. I. Wu, S. Nishizawa and O. Hashimoto: Sci. Tech. Adv. Mater., 7 (2006) 84 https://doi.org/10.1016/j.stam.2005.11.007
  8. V. V. Varadan, R. D. Hollinger, D. K. Ghodgaonkar and V. K. Varadan: IEEE Trans. Instrum. Meas., 40 (1991) 842 https://doi.org/10.1109/19.106308
  9. M. Arai, J. G. P. Binner, G. E. Carr and T. E. Cross:Microwave Processing of Materials III, R. L. Beatty, W. H. Sutton and M. F. Iskander(Ed.), Vol. 269, MRS Symp. Proceedings (1992) 611
  10. R. Hutcheon, M. de Jong and F. Adams: J. Microwave Power EE., 27 (1992) 87
  11. A. Das and S. Das: Microwave Engineering, McGraw-Hill International Edition, Singapore (2001) 235
  12. R. P. Feynman, R. B. Leighton and M. Sands: The Feynman Lectures on Physics, Addison Wesley Publishing Co., Inc., Volume II, Reading, Massachusetts (1989) 23-2
  13. H. M. Altschuler: Chapter IX-Dielectric Constant, Handbook of Microwave Measurements, M. Sucher and J. Fox(Ed.), Polytechnic Press, Interscience Publishers, Vol. 2
  14. J. D. Walton, Jr.: Inorganic Randoms in Randome Engineering Handbook, J. D. Walton, Jr.(Ed.), Marcel Dekker, Inc., New York (1970) 229
  15. S. J. Penn, N. M. Alford, A. Templeton, X. Wang, M. Xu, M. Reece and K. Schrapel: J. Am. Ceram. Soc., 80 (1997) 1885 https://doi.org/10.1111/j.1151-2916.1997.tb03066.x
  16. M. Arai, J. G. P. Binner, A. L. Bowden, T. E. Cross, N. G. Evans, M. G. Hamlyn, R. Hutcheon, G. Morin and B. Smith: Microwave : theory and application in materials processing, D. E. Clark, J. R. Laia, W. R. Tinga(Ed.), Vol. 36, The American Ceramic Society, Ohio (1993) 539

Cited by

  1. Dielectric Properties of β-SiAlON at High Temperature Using Perturbation Method vol.403, pp.1662-9795, 2008, https://doi.org/10.4028/www.scientific.net/KEM.403.121