백색광 주사간섭법을 이용한 표면미세형상 측정과 그 적용

Application of White Light Interferometery Method for the Measurement of Surface Micro-structure of Paper Products and Prints

  • 성용주 (한국화학연구원 펄프제지연구센터) ;
  • 류정용 (한국화학연구원 펄프제지연구센터) ;
  • 송봉근 (한국화학연구원 펄프제지연구센터)
  • Sung Yong Joo (Pulp and Paper Research Center (PPRC), Korea Research Institute of Chemical Technology (KRICT)) ;
  • Ryu Jeong Yong (Pulp and Paper Research Center (PPRC), Korea Research Institute of Chemical Technology (KRICT)) ;
  • Song Bong Keun (Pulp and Paper Research Center (PPRC), Korea Research Institute of Chemical Technology (KRICT))
  • 발행 : 2004.12.01

초록

A white light interferometery (WLI) method for investigating surface microstructure was introduced. Brief description of the principle of this method was provided. The surface structure of various samples, for example, a liner board paper, a pigment coated paper, a intaglio printed paper and a polymer laminated paper were tested and characterized with the WLI method. The data showed the WLI method provided very detailed information about surface topography, which were little affected by the surface condition such as color, opacity, roughness, etc. The data stitching mode of the WLI method could provide high spatial resolution over a large field-of-view, which made it possible to obtain the statistically valid results. Fast and high repeatability also made this method a promising way for investigating the surface micro-structure of paper products and prints.

키워드

참고문헌

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