Journal of the Korean institute of surface engineering (한국표면공학회지)

The Korean Institute of Surface Engineering (한국표면공학회)
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Application of Small Angle Neutron Scattering to Determine Nano-size Cracks in Trivlent Chromium Layers

3가 크롬 박막 내의 극미세 결함 측정을 위한 중성자 소각 산란법의 적용

  • Choi, Yong (Division of Advanced Materials and Bio-Chemical Engineering, Sunmoon University)
  • 최용 (선문대학교 신소재생명화학공학부)
  • Published : 2004.06.01
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Abstract

The size and number of nano-size defects of thin trivalent chrome layers were determined by small angle neutron scattering (SANS) without breaking the thin chrome layers. Most of defect size of the trivalent chromium prepared in this test conditions is in the range of about 40nm. The number of nano-size defects less than about 40nm of the trivalent chromium layer increases with plating voltage at constant current density From this study, SANS is proved as one of useful techniques to evaluate nano-size defects of thin film layer.

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References

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